US2018100897A1PendingUtilityA1

Semiconductor integrated circuit having battery control function and operation method thereof

Assignee: RENESAS ELECTRONICS CORPPriority: May 30, 2011Filed: Dec 12, 2017Published: Apr 12, 2018
Est. expiryMay 30, 2031(~4.8 yrs left)· nominal 20-yr term from priority
G01R 31/3651G06F 1/263G01R 31/3679G01R 31/3606G01R 31/3662G01R 31/3648G01R 31/361G01R 31/382G01R 31/367G01R 31/3828G01R 31/392G01R 31/389
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Claims

Abstract

A semiconductor integrated circuit is capable of being supplied with battery current information and battery voltage information. The semiconductor integrated circuit includes a memory function, a current integrating function, a voltage-based state of charge operating function, a current-based state of charge operating function, a comparison determination function, a correcting function, and a resistance deterioration coefficient output function. The memory function stores the relation between a state of charge of a battery and an internal resistance deterioration coefficient thereof. The full charge capacity outputted from the correcting function and the internal resistance deterioration coefficient outputted from the resistance deterioration coefficient output function are stored in the memory function when a voltage-based state of charge and a current-based state of charge compared by the comparison determination function are determined to substantially coincide with each other.

Claims

exact text as granted — not AI-modified
1 - 20 . (canceled) 
     
     
         21 . A method of operating a semiconductor integrated circuit including a battery control function configured to control a battery, the method comprising the steps of:
 (a) storing a relation between a full charge capacity and an internal resistance deterioration coefficient of the battery in a memory unit;   (b) supplying current information and voltage information of the battery to the semiconductor integrated circuit; and   (c) storing the full charge capacity and an internal resistance deterioration coefficient of the battery in the memory unit when a voltage-based state of charge and a current-based state of charge have a same value,
 wherein: 
   the semiconductor integrated circuit comprises:
 the memory unit; 
 a current integrating unit; 
 a voltage-based state of charge operating unit; 
 a current-based state of charge operating unit; 
 a comparison determination unit; 
 a correcting unit, and 
 a resistance deterioration coefficient output unit; and 
   the method further comprises after step (b):
 determining a voltage-based state of charge; 
 determining a current-based state of charge; 
 determining a comparison output signal based on the voltage-based state of charge and the current-based state of charge; 
 calculating a corrected value of the full charge capacity, based on an initial value of the full charge capacity and the comparison output signal; and 
 calculating an internal resistance deterioration coefficient, in response to the corrected value of the full charge capacity. 
   
     
     
         22 . A battery monitoring semiconductor device comprising:
 (a) a current detection circuit configured to detect a current of a battery;   (b) a voltage detection circuit configured to detect a voltage of the battery; and   (c) a calculation circuit configured to calculate a full charge capacity of the battery based on the current of the battery and the voltage of the battery.   
     
     
         23 . The battery monitoring semiconductor device according to  claim 22 , wherein the calculation circuit comprises:
 (d) a first capacity calculation circuit configured to calculate a charged capacity based on the current of the battery;   (e) a second capacity calculation circuit configured to calculate the charged capacity based on the voltage of the battery; and   (f) a correction circuit configured to correct the full charge capacity by comparing the charged capacity based on the current of the battery with the charged capacity based on the voltage of the battery.   
     
     
         24 . The battery monitoring semiconductor device according to  claim 23 , wherein the calculation circuit determines the full charge capacity upon a substantially coincident of the charged capacity based on the current of the battery and the charged capacity based on the voltage of the battery. 
     
     
         25 . A method for monitoring states of a battery, comprising:
 detecting a current of the battery;   detecting a voltage of the battery; and   calculating a full charge capacity of the battery based on the current of the battery and the voltage of the battery.   
     
     
         26 . The method according to  claim 25 , the calculating comprising:
 calculating a charged capacity based on the current of the battery;   calculating the charged capacity based on the voltage of the battery; and   correcting the full charge capacity by comparing the charged capacity based on the current of the battery with the charged capacity based on the voltage of the battery.   
     
     
         27 . The method according to  claim 26 , further comprising:
 determining the full charge capacity upon a substantially coincident of the charged capacity based on the current of the battery and the charged capacity based on the voltage of the battery.

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