Self-diagnosis device and self-diagnosis method

Abstract

A semiconductor device includes a plurality of functional blocks, and a self-diagnosis circuit that controls a test for the functional blocks. When an interruption request is issued, the self-diagnosis circuit executes a test for one of the functional blocks.

What is claimed is: 
     
         1 . A semiconductor device, comprising:
 a plurality of functional blocks; and   a self-diagnosis circuit that controls a test for the functional blocks,   wherein, when an interruption request is issued, the self-diagnosis circuit executes a test for one of the functional blocks.   
     
     
         2 . The semiconductor device according to  claim 1 , wherein the one of the functional blocks includes a block which executes a process associated with the interruption request. 
     
     
         3 . The semiconductor device according to  claim 2 , wherein the test for the block which executes the process associated with the interruption request is executed before the process associated with the interruption request is executed. 
     
     
         4 . The semiconductor device according to  claim 1 , further comprising:
 a memory that stores a schedule of the self-diagnosis circuit,   wherein the self-diagnosis circuit executes the test for the functional blocks based on the schedule when no interruption request is issued.   
     
     
         5 . The semiconductor device according to  claim 4 , wherein the schedule includes information about the functional blocks to be tested. 
     
     
         6 . A self-diagnosis method of a semiconductor device including a plurality of functional blocks and a self-diagnosis circuit, the method comprising:
 detecting an interruption request by the self-diagnosis circuit; and   executing a test for one of the functional blocks by the self-diagnosis circuit when the interruption request is detected.   
     
     
         7 . The self-diagnosis method according to  claim 6 , wherein the one of the functional blocks includes a block which executes a process associated with the interruption request. 
     
     
         8 . The self-diagnosis method according to  claim 7 , wherein the test for the block which executes the process associated with the interruption request is executed before the process associated with the interrupt request is executed. 
     
     
         9 . The self-diagnosis method according to  claim 6 , the semiconductor device further comprising:
 a memory that stores a schedule of the self-diagnosis circuit,   the method further comprising:
 executing the test for the functional blocks based on the schedule when no interruption request is detected. 
   
     
     
         10 . The self-diagnosis method according to  claim 9 , wherein the schedule includes information about the functional blocks to be tested.