US2018079109A1PendingUtilityA1

Method for manufacturing hexagonal semiconductor plate crystal

Assignee: MITSUBISHI CHEM CORPPriority: Dec 28, 2010Filed: Nov 29, 2017Published: Mar 22, 2018
Est. expiryDec 28, 2030(~4.4 yrs left)· nominal 20-yr term from priority
B28D 5/045B24B 27/0633C30B 29/64C30B 29/406C30B 33/06C30B 29/403H10P 52/00B28D 5/00
60
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Claims

Abstract

A plate crystal cut from a gallium nitride crystal with a crystal cutting wire, where the plate crystal has a principal face of (20−21), and a magnitude of warpage of the plate crystal is 1.0 μm/mm or less in a line along the perpendicular projection of the c axis on the principal face passing through the center of the principal face.

Claims

exact text as granted — not AI-modified
1 - 9 . (canceled) 
     
     
         10 : A plate crystal cut from a gallium nitride crystal with a crystal cutting wire, wherein the plate crystal has a principal face of (20−21), and a magnitude of warpage of the plate crystal is 1.0 μm/mm or less in a line along the perpendicular projection of the c axis on the principal face passing through the center of the principal face. 
     
     
         11 : The plate crystal according to  claim 10 , wherein the magnitude of warpage of the plate crystal is 0.8 μm/mm or less. 
     
     
         12 : The plate crystal according to  claim 10 , wherein the magnitude of warpage of the plate crystal is 0.5 μm/mm or less. 
     
     
         13 : The plate crystal according to  claim 10 , wherein the magnitude of warpage of the plate crystal is 0.3 μm/mm or less. 
     
     
         14 : The plate crystal according to  claim 10 , wherein the plate crystal has a square shape of 5 mm to 10 mm, and a magnitude of warpage per evaluated length 5 mm of the plate crystal is less than 5 run in the line. 
     
     
         15 : The plate crystal according to  claim 10 , wherein the plate crystal has a disk-like shape. 
     
     
         16 : The plate crystal according to  claim 15 , wherein a maximum diameter of the plate crystal is equal to or more than 10 mm. 
     
     
         17 : The plate crystal according to  claim 15 , wherein a maximum diameter of the plate crystal is equal to or more than 20 mm. 
     
     
         18 : The plate crystal according to  claim 15 , wherein a maximum diameter of the plate crystal is equal to or more than 25 mm. 
     
     
         19 : The plate crystal according to  claim 15 , wherein the plate crystal has diameter of 2 inches, and a magnitude of warpage per evaluated length 50 mm of the plate crystal is less than 40 μm in the line. 
     
     
         20 : The plate crystal according to  claim 19 , wherein the magnitude of warpage per evaluated length 50 mm of the plate crystal is less than 30 μm in the line. 
     
     
         21 : The plate crystal according to  claim 19 , wherein the magnitude of warpage per evaluated length 50 mm of the plate crystal is less than 20 μm in the line.

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