Apparatus and method for testing conductivity of graphene

Abstract

According to the present invention, oxidized and reduced regions of graphene can be accurately detected in a short time using a terahertz wave so as to measure the conductivity of graphene, and thus the time required to test the conductivity of graphene can be reduced. In addition, when an oxidized region exists in graphene, the oxidized region can be immediately reduced by irradiating an electromagnetic wave thereto so as to increase the conductivity of graphene and thus minimize the time required to restore graphene.

1 . An apparatus for testing the conductivity of graphene, comprising a light processing unit for irradiating terahertz waves onto graphene and receiving the terahertz waves reflected from or transmitted through the graphene, a determination unit for detecting the terahertz waves from the light processing unit to detect oxidized and reduced regions of the graphene, and a display unit for imaging data processed in the determination unit. 
     
     
         2 . The apparatus according to  claim 1 , wherein the terahertz waves are irradiated from a pulsed or continuous light source. 
     
     
         3 . The apparatus according to  claim 2 , wherein the light source is provided in plurality. 
     
     
         4 . The apparatus according to  claim 2 , wherein the terahertz waves have wavelengths of 30 μm to 3 mm. 
     
     
         5 . The apparatus according to  claim 1 , wherein the light processing unit comprises a holder adapted to fix the graphene, a light emitter placed above the graphene holder and comprising a light source adapted to irradiate terahertz waves, and a photosensor adapted to receive the terahertz waves reflected from or transmitted through the graphene. 
     
     
         6 . The apparatus according to  claim 1 , further comprising a restoration unit for irradiating electromagnetic waves onto the oxidized regions of the graphene detected in the determination unit to reduce the oxidized regions. 
     
     
         7 . The apparatus according to  claim 6 , wherein the electromagnetic waves are pulsed or continuous and have wavelengths of 160 nm to 2.5 μm. 
     
     
         8 . The apparatus according to  claim 6 , wherein the electromagnetic waves are pulsed and have a pulse width of 0.1 to 10 ms, a pulse gap of 0.1 to 100 ms, and a pulse number of 1 to 1,000. 
     
     
         9 . A method for testing the conductivity of graphene, comprising (a) fixing graphene to a specimen stage, (b) irradiating terahertz waves onto the graphene, (c) detecting the terahertz waves reflected from or transmitted through the graphene, (d) analyzing the detected terahertz waves to obtain an image, and (e) detecting oxidized regions of the graphene through the image. 
     
     
         10 . The method according to  claim 9 , wherein the terahertz waves are irradiated from a pulsed or continuous light source. 
     
     
         11 . The method according to  claim 9 , wherein the terahertz waves are irradiated from one or more light sources. 
     
     
         12 . The method according to  claim 9 , wherein the terahertz waves have wavelengths of 30 μm to 3 mm. 
     
     
         13 . The method according to  claim 9 , further comprising irradiating electromagnetic waves onto the oxidized regions of the graphene detected in step (e) to reduce the oxidized regions. 
     
     
         14 . The method according to  claim 13 , wherein the electromagnetic waves are pulsed or continuous and have wavelengths of 160 nm to 2.5 μm. 
     
     
         15 . The method according to  claim 13 , wherein the electromagnetic waves are pulsed and have a pulse width of 0.1 to 10 ms, a pulse gap of 0.1 to 100 ms, and a pulse number of 1 to 1,000. 
     
     
         16 . The method according to  claim 9 , wherein the graphene is an electrode device or a transparent electrode.