US2017322062A1PendingUtilityA1

Thermal Air Flow Sensor

Assignee: HITACHI AUTOMOTIVE SYSTEMS LTDPriority: Nov 28, 2011Filed: Jul 26, 2017Published: Nov 9, 2017
Est. expiryNov 28, 2031(~5.3 yrs left)· nominal 20-yr term from priority
G01F 1/69G01F 1/692
59
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

A thermal air flow sensor that produces less measurement error is provided. The thermal air flow sensor includes: a semiconductor substrate; a heating resistor, resistance temperature detectors, and an electrical insulator that includes a silicon oxide film, wherein the heating resistor, the resistance temperature detectors, and the electrical insulator are formed on the semiconductor substrate; and a diaphragm portion formed by removing a portion of the semiconductor substrate. The heating resistor and the resistance temperature detectors are formed on the diaphragm portion. The thermal air flow sensor further includes a silicon nitride film formed as the electrical insulator above the heating resistor and the resistance temperature detectors. The silicon nitride film has steps conforming to the patterns of the heating resistor and the resistance temperature detectors. The silicon nitride film has a multilayer structure.

Claims

exact text as granted — not AI-modified
1 . A thermal air flow sensor comprising:
 a semiconductor substrate;   a heating resistor, resistance temperature detectors, and an electrical insulator that includes a silicon oxide film, wherein the heating resistor, the resistance temperature detectors, and the electrical insulator are formed on the semiconductor substrate; and   the heating resistor and the resistance temperature detectors being formed on a diaphragm portion of the semiconductor substrate;   the silicon oxide film formed as the electrical insulator being disposed on the heating resistor and the resistance temperature detectors;   the thermal air flow sensor further comprising a silicon nitride film laminated on the silicon oxide film;   wherein steps are arranged on the silicon oxide film, and the steps correspond to patterns of the heating resistor and the resistance temperature detectors; and   wherein a thickness of the silicon oxide film where the heating resistor and the resistance temperature detectors are disposed is smaller than a thickness of the silicon oxide film where the heating resistor and the resistance temperature detectors are not disposed.   
     
     
         2 . The thermal air flow sensor according to  claim 1 , wherein heights of the steps are smaller than heights of the heating resistor and the resistance temperature detectors. 
     
     
         3 . The thermal air flow sensor according to  claim 1 , wherein the silicon nitride film comprises plural layers. 
     
     
         4 . The thermal air flow sensor according to  claim 1 , wherein a hillock is formed on the heating resistor and the resistance temperature detectors.

Join the waitlist — get patent alerts

Track US2017322062A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.