US2017294504A1PendingUtilityA1
Laminated structures for power efficient on-chip magnetic inductors
Est. expiryDec 22, 2035(~9.4 yrs left)· nominal 20-yr term from priority
H10P 76/204H10P 50/71H10P 14/412H01F 1/14708H01F 10/3254H01F 1/147H01L 28/10H01F 10/3218H01L 21/32051H01F 41/042H01F 27/2804H01L 21/32139H01F 2027/2809H01F 27/24H01L 21/0273H10D 1/20H01F 10/3295H01F 41/304H01F 10/3268H01F 17/0006H01F 2017/0066C23C 14/14
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Claims
Abstract
Disclosed are magnetic structures, including on-chip inductors comprising laminated layers comprising, in order, a barrier and/or adhesion layer, a antiferromagnetic layer, a magnetic growth layer, a soft magnetic layer, an insulating non-magnetic spacer, a soft magnetic layer, a magnetic growth later, an antiferromagnetic layer. Also disclosed are methods of making such structures.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A laminated magnetic structure comprising, in order, the following layers, from a supporting substrate:
a first sequence of layers comprising a barrier layer or an adhesion layer, a first antiferromagnetic layer, a first magnetic growth layer, and a first soft magnetic layer, wherein the first soft magnetic layer is pinned by the first antiferromagnetic layer; an insulating non-magnetic spacer located between the first sequence of layers and a second sequence of layers; and the second sequence of layers comprising a second soft magnetic layer, a second magnetic growth layer, and a second antiferromagnetic layer, wherein the second soft magnetic layer is pinned by the second antiferromagnetic layer.
2 . The magnetic structure of claim 1 , wherein the first soft magnetic layer is directly deposited on a surface of the first magnetic growth layer, and wherein the second magnetic growth layer is directly deposited on a surface of the second soft magnetic layer.
3 . The magnetic structure of claim 1 , wherein the first antiferromagnetic layer is in direct contact with the first magnetic growth layer and the first magnetic growth layer is in direct contact with the first soft magnetic layer.
4 . The magnetic structure of claim 3 , wherein the second antiferromagnetic layer is in direct contact with the second magnetic growth layer and the second magnetic growth layer is in direct contact with the second soft magnetic layer.
5 . The magnetic structure of claim 4 , wherein each layer comprises a plurality of sub-layers.
6 . The magnetic structure of claim 1 , wherein the structure comprises a quality factor of about 10 to about 20 at 20 MHz to 500 MHz.
7 . The magnetic structure of claim 1 , wherein the structure exhibits a magnetic loss tangent of about 0.04 to about 0.10 at 100 MHz.
8 . The magnetic structure of claim 1 , wherein the first and second antiferromagnetic layer comprise the same or different materials selected from the group consisting of an alloy of manganese, an alloy comprising platinum and manganese, an alloy comprising iron and manganese, an alloy comprising nickel and manganese, an alloy of manganese, zinc, and nickel, or nickel oxide (NiO).
9 . The magnetic structure of claim 1 , wherein the first and second magnetic growth layers comprise cobalt or iron.
10 . The magnetic structure of claim 1 , wherein the first and second soft magnetic layers comprise a material selected from the group consisting of CoFeB, CoFeNiB, FeB, CoFeRuB, CoFeRhB, CoFeRhB, CoFePtB, CoWB, CoWP, CoP, CoB, CoMoP, CoMoB, NiFe, NiFeB, NiFeCo, NiFeCo, and combinations thereof.
11 . The magnetic structure of claim 1 , wherein the first and second soft magnetic layers comprise cobalt, iron, and boron.
12 . The magnetic structure of claim 1 , wherein the non-magnetic insulating layer comprises Al 2 O 3 or MgO.
13 . The magnetic structure of claim 1 further comprising an ordered sequence of layers selected from the group consisting of IrMn/Co 90 Fe 10 /CoFeB, IrMn/Co 90 Fe 10 /CoFeB, IrMn/Co 50 Fe 50 /CoFeB, and IrMn/Co 50 Fe 50 /CoFeB.
14 . The magnetic structure of claim 1 , wherein the insulating non-magnetic spacer is pinhole free and produces interlayer anti-ferromagnetic coupling with the soft magnetic layers.
15 . The magnetic structure of claim 1 further comprising one or more additional sequences, each additional sequence separated by an insulating non-magnetic spacer.
16 . The magnetic structure of claim 1 , wherein the magnetic structure comprises a thickness of about 0.5 to 5 micrometers.
17 . A thin film inductor comprising conductive elements in association with a laminated magnetic structure comprising, in order, the following layers, from a supporting substrate:
a first sequence of layers comprising a barrier layer or an adhesion layer, a first antiferromagnetic layer, a first magnetic growth layer, and a first soft magnetic layer, wherein the first soft magnetic layer is pinned by the first antiferromagnetic layer; an insulating non-magnetic spacer located between the first sequence of layers and a second sequence of layers; the second sequence of layers comprising a second soft magnetic layer, a second magnetic growth layer, and a second antiferromagnetic layer, wherein the second soft magnetic layer is pinned by the second antiferromagnetic layer; and wherein the magnetic layers form a planar inductor.
18 . The thin film inductor of claim 17 , wherein the laminated magnetic structure comprises a Q of 10 to 20 at 20 MHz to 500 MHz.
19 . The thin film inductor of claim 17 , wherein the laminated magnetic structure comprises a magnetic loss tangent of about 0.04 to about 0.10 at 100 MHz.
20 . A system comprising the inductor of claim 17 in association with an electronic device and a power supply or power converter incorporating the inductor on-chip, comprising the laminated magnetic structure, wherein the system comprises a microprocessor.Join the waitlist — get patent alerts
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