US2017276685A1PendingUtilityA1
Embossed Cell Analyte Sensor and Methods of Manufacture
Est. expiryOct 24, 2026(~0.2 yrs left)· nominal 20-yr term from priority
C12Q 1/006Y10T29/49764Y10T29/49004Y10T436/144444Y02P20/582G01N 33/487Y10T29/49826G01N 33/66A61B 5/145G01N 27/3272
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Claims
Abstract
An analyte measurement system is provided having sensors with embossed test chamber channels. In one embodiment, the sensors are elongate test strips for in vitro testing, each test strip having a substrate, at least one electrode, an embossed channel in the electrode, and lidding tape covering at least a portion of the embossed channel. Methods of manufacture are also disclosed for filling the sensor channels with reagent, and for trimming the ends of the sensors to eliminate the need for a calibration code during use of the sensors with a meter.
Claims
exact text as granted — not AI-modified1 - 12 . (canceled)
13 . A method of manufacturing a plurality of analyte sensor having similar operating characteristics, the method comprising:
forming a plurality of substantially functional analyte sensors connected to one another, each sensor having a channel extending to an edge of the sensor; separating a first analyte sensor from the plurality of analyte sensors; testing the first sensor to determine a calibration parameter of the sensor; based on the calibration parameter of the tested sensor, trimming a predetermined amount from one or more of the edges of the plurality of the non-tested sensors simultaneously, thereby changing a calibration parameter of the plurality of sensors; and separating the plurality of connected functional analyte sensors into individual analyte sensors.
14 . The method of claim 13 , wherein trimming comprises reducing a sample volume of one or more channels of each of the plurality of functional analyte sensors.
15 . The method of claim 14 , wherein the channels extend perpendicular to the longitudinal axis of the sensor.
16 . The method of claim 15 , wherein the channel is completely covered by a substrate.
17 . The method of claim 14 , wherein the channels extend longitudinally along the sensors.
18 . The method of claim 14 , further comprising embossing the channels prior to forming the plurality of substantially functional analyte sensors.
19 . The method of claim 13 , further comprising:
forming channels after patterning a plurality of electrodes on the sensors, wherein the forming of the plurality of substantially functional analyte sensors comprises patterning the plurality of electrodes on the sensors, and wherein each channel traverses at least one electrode.
20 . The method of claim 13 , wherein trimming comprises reducing an area of one or more electrodes of each of the plurality of functional analyte sensors.
21 . The method of claim 13 , wherein separating the plurality of connected functional analyte sensors comprises cutting along an edge that is perpendicular to the trimmed edge to singulate an individual functional analyte sensor from the plurality of connected functional analyte sensors.
22 . The method of claim 13 , wherein separating of the non-tested sensors is after the trimming of the predetermined amount from the edges of the non-tested sensors.
23 . The method of claim 13 , further comprising:
testing at least one of the non-tested sensors to determine a new calibration parameter of the non- tested sensors; based on the new calibration parameter, trimming a predetermined amount from the edges of the non- tested sensors that have previously been trimmed, thereby reducing a sample volume of-the channels of the non-tested sensors and again changing a calibration parameter of the non-tested sensors.
24 . The method of claim 23 , further comprising:
separating the non-tested sensors into individual sensors before the testing to determine the new calibration parameter.
25 . The method of claim 23 , further comprising:
separating the non-tested sensors into individual sensors after the testing to determine the new calibration parameter and after the trimming of the predetermined amount based on the new calibration parameter.
26 . The method of claim 13 , further comprising the step of packing the trimmed sensors in at least one package without an indication of a calibration parameter included with the package.
27 . The method of claim 13 , further comprising:
chamfering corners of the edge of the non-tested sensors.Join the waitlist — get patent alerts
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