US2017243847A1PendingUtilityA1

Semiconductor device

Assignee: RENESAS ELECTRONICS CORPPriority: Jul 24, 2009Filed: May 5, 2017Published: Aug 24, 2017
Est. expiryJul 24, 2029(~3 yrs left)· nominal 20-yr term from priority
H10W 74/15H10W 72/952H10W 72/923H10W 72/07251H10W 72/251H10W 72/20H10W 99/00H10W 90/734H10W 90/724H10W 72/255H10W 72/252H10W 72/248H10W 72/241H10W 72/227H10W 72/072H10W 20/4403H10W 20/425H10W 20/48H10W 90/701H10W 20/4405H10W 20/43H10W 20/42G02F 1/13452G02F 1/13306H01L 23/528H01L 2224/16227H01L 2224/1412H01L 2224/81191H01L 24/17H01L 2224/1403H01L 2924/1426H01L 2224/13144H01L 23/53214H01L 23/5226H01L 2224/32225H01L 2224/9211H01L 27/0255H01L 2924/10161H01L 2224/73204H10D 89/921H10D 89/611H10D 89/60H10D 89/10H10W 74/01H10P 95/00H10P 72/00
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Claims

Abstract

To provide a technique capable of reducing the chip size of a semiconductor chip and particularly, a technique capable of reducing the chip size of a semiconductor chip in the form of a rectangle that constitutes an LCD driver by devising a layout arrangement in a short-side direction. In a semiconductor chip that constitutes an LCD driver, input protection circuits are arranged in a lower layer of part of a plurality of input bump electrodes and on the other hand, in a lower layer of the other part of the input bump electrodes, the input protection circuits are not arranged but SRAMs (internal circuits) are arranged.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A semiconductor device comprising a semiconductor chip in the form of a rectangle having a first short side, a second short side opposite to the first short side, a first long side and a second long side opposite to the first long side, wherein the semiconductor chip includes:
 (a) a first plurality of first bump electrodes linearly arranged along the first long side of the semiconductor chip and arranged closer to the first long side than to the second long side; and   (b) a first electrostatic protection circuit which protects the semiconductor device against static electricity and is electrically coupled to the first bump electrodes,   wherein the first electrostatic protection circuit is arranged without overlapping any of the first bump electrodes in a plan view.   
     
     
         2 . The semiconductor device according to  claim 1 , wherein the first bump electrodes are electrically coupled to an internal circuit via the first electrostatic protection circuits. 
     
     
         3 . The semiconductor device according to  claim 1 , further comprising:
 (c) a second plurality of second bump electrodes linearly arranged along the first long side of the semiconductor chip and arranged closer to the first long side than to the second long side,   wherein the first electrostatic protection circuit overlaps the second bump electrodes in the plan view.   
     
     
         4 . The semiconductor device according to  claim 3 , wherein the second bump electrodes are electrically coupled to the internal circuit via the first electrostatic protection circuits. 
     
     
         5 . The semiconductor device according to  claim 4 , wherein the number of the second bump electrodes is smaller than the number of the first bump electrodes. 
     
     
         6 . The semiconductor device according to  claim 3 , wherein:
 the semiconductor chip comprises a semiconductor substrate;   a plurality of wiring layers are formed over the semiconductor substrate;   first and second wirings are formed at an uppermost layer of the wiring layers and extend along the first long side, with the first wiring being arranged between the second wiring and the first long side, and   an insulating film is formed over the first and second wirings;   the first plurality of first bump electrodes are formed over the first and second wirings, and are connected to the first wiring through first openings formed in the insulating film; and   the second plurality of second bump electrodes are formed over the first and second wirings, and are connected to the second wiring through second openings formed in the insulating film; wherein:   all of the second openings are farther from the first long side than any of first openings.   
     
     
         7 . The semiconductor device according to  claim 6 , wherein:
 the first and second wirings include an aluminum film; and   the first and second bump electrodes include a gold film.   
     
     
         8 . The semiconductor device according to  claim 6 ,
 wherein the first wiring is different from the second wiring.   
     
     
         9 . The semiconductor device according to  claim 8 , wherein:
 none of the first plurality of first bump electrodes is connected to the second wiring, and   none of the second plurality of second bump electrode is connected to the first wiring.   
     
     
         10 . The semiconductor device according to  claim 6 , wherein:
 the first and second wirings extend parallel to one another as they pass under the first plurality of first bump electrodes and the second plurality of second bump electrodes, in a plan view of the device.   
     
     
         11 . The semiconductor device according to  claim 10 , wherein:
 the first and second wirings do not overlap one another as they pass under the first plurality of first bump electrodes and the second plurality of second bump electrodes, in a plan view of the device.   
     
     
         12 . A liquid crystal display having a driver comprising a semiconductor device in accordance with  claim 1 .

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