US2017221586A1PendingUtilityA1

Sorting non-volatile memories

Assignee: IBMPriority: Jan 28, 2016Filed: Dec 5, 2016Published: Aug 3, 2017
Est. expiryJan 28, 2036(~9.5 yrs left)· nominal 20-yr term from priority
G11C 29/50004G11C 29/56008G11C 16/349G11C 29/44G11C 16/04G11C 29/38G11C 29/50
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Claims

Abstract

A computer-implemented method for sorting non-volatile random access memories (NVRAMS) includes testing a failure metric for each of a plurality of NVRAMS over a plurality of testing sessions to capture failure metric data that corresponds to the plurality of NVRAMS. The method also includes determining a trend in the failure metric as a function of testing cycles for each of the plurality of NVRAMS from the failure metric data, and separating the plurality of NVRAMS into groups based on the trend in the failure metric as a function of testing cycles. A corresponding computer program product and computer system are also disclosed herein.

Claims

exact text as granted — not AI-modified
1 . A computer program product comprising:
 one or more computer readable storage media and program instructions stored on the one or more computer readable storage media, the program instructions comprising instructions to execute a method comprising:   testing, via the one or more processors, a failure metric for each of a plurality of flash memories over a plurality of testing sessions to capture failure metric data that corresponds to the plurality of flash memories;   weighting, via the one or more processors, the failure metric data according to the testing session;   determining, via the one or more processors, a trend in the failure metric as a function of testing cycles for each of the plurality of flash memories from the failure metric data;   repetitively conducting testing sessions, via the one or more processors, until a selected confidence level is attained for the trend in the failure metric as a function of testing cycles;   clustering, via the one or more processors, the trends in the failure metric as a function of testing cycles to provide a plurality of clustered groups for the failure metric data;   physically separating, via the one or more processors, the plurality of flash memories into routing groups and routing the routing groups according to the plurality of clustered groups;   wherein the failure metric comprises an additional bad blocks count; and   wherein the plurality of clustered groups comprise a scrap or rework group, an acceptable quality group, and an exceptional quality group and routing the routing groups comprises routing the scrap or rework group to a scrapping station or reworking station within a manufacturing environment.

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