US2017186984A1PendingUtilityA1
Thin film of metal oxide, organic electroluminescent device including thin film, photovoltaic cell including thin film, and manufacturing method of thin film
Assignee: JAPAN SCIENCE & TECH AGENCYPriority: Sep 18, 2014Filed: Mar 16, 2017Published: Jun 29, 2017
Est. expirySep 18, 2034(~8.2 yrs left)· nominal 20-yr term from priority
Inventors:Hideo HosonoYoshitake TodaSatoru WatanabeToshinari WatanabeKazuhiro ItoNaomichi MiyakawaNobuhiro Nakamura
H10P 14/3434H10P 14/22C23C 14/352C23C 14/086Y02E10/549H01J 37/3429C23C 14/3414C23C 14/3407H01L 31/0324H01L 2031/0344H01L 51/4233H10K 30/50H10K 30/152C23C 14/08H10F 71/00H10F 77/12H10F 77/127H10K 50/16H10F 77/169H10K 50/171H10K 2102/00H10K 2102/102Y02P70/50
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Claims
Abstract
A thin film of metal oxide includes zinc (Zn); tin (Sn); silicon (Si); and oxygen (O). In terms of oxide, based on 100 mol % of total of oxides of the thin film, SnO 2 is greater than 15 mol % but less than or equal to 95 mol %.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A thin film of metal oxide, comprising:
zinc (Zn); tin (Sn); silicon (Si); and oxygen (O), wherein in terms of oxide, based on 100 mol % of total of oxides of the thin film, SnO 2 is greater than 15 mol % but less than or equal to 95 mol %.
2 . The thin film according to claim 1 ,
wherein in terms of oxide, based on 100 mol % of total of the oxides of the thin film, SiO 2 is greater than or equal to 7 mol % but less than or equal to 30 mol %.
3 . The thin film according to claim 1 ,
wherein a thickness of the thin film is greater than or equal to 10 nm but less than or equal to 2000 nm.
4 . An organic electroluminescent device including a thin film,
wherein the thin film is a thin film of metal oxide including zinc (Zn), tin (Sn), and oxygen (O), and wherein in terms of oxide, based on 100 mol % of total of oxides of the thin film, SnO 2 is greater than 15 mol % but less than or equal to 95 mol %.
5 . The organic electroluminescent device according to claim 4 ,
wherein the thin film includes silicon (Si).
6 . The organic electroluminescent device according to claim 5 ,
wherein in terms of oxide, based on 100 mol % of total of the oxides of the thin film, SiO 2 of the thin film is greater than or equal to 7 mol % but less than or equal to 30 mol %.
7 . The organic electroluminescent device according to claim 4 ,
wherein the thin film does not substantially include silicon (Si).
8 . The organic electroluminescent device according to claim 4 ,
wherein a thickness of the thin film is greater than or equal to 10 nm but less than or equal to 2000 nm.
9 . A photovoltaic cell including a thin film,
wherein the thin film is a thin film of metal oxide including zinc (Zn), tin (Sn), and oxygen (O), and wherein in terms of oxide, based on 100 mol % of total of oxides of the thin film, SnO 2 is greater than 15 mol % but less than or equal to 95 mol %.
10 . The photovoltaic cell according to claim 9 ,
wherein the thin film includes silicon (Si).
11 . The photovoltaic cell according to claim 10 ,
wherein in terms of oxide, based on 100 mol % of total of the oxides of the thin film, SiO 2 of the thin film is greater than or equal to 7 mol % but less than or equal to 30 mol %.
12 . The photovoltaic cell according to claim 9 ,
wherein the thin film does not substantially include silicon (Si).
13 . The photovoltaic cell according to claim 9 ,
wherein a thickness of the thin film is greater than or equal to 10 nm but less than or equal to 2000 nm.
14 . A manufacturing method of the thin film according to claim 1 , comprising:
before forming the thin film in a chamber by a sputtering method, reducing a pressure in the chamber to 8.0×10 −4 Pa or less; introducing a sputtering gas into the chamber; and setting the pressure in the chamber to 0.1 Pa or more but 5.0 Pa or less, to perform deposition of the thin film.
15 . The manufacturing method of the thin film according to claim 14 ,
wherein a target used in the sputtering method includes Zn, Sn, and Si, wherein an atomic fraction of Silicon atoms as defined by Si/(Zn+Sn+Si) in the target is greater than or equal to 0.01 but less than or equal to 0.70.Join the waitlist — get patent alerts
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