US2017133826A1PendingUtilityA1

Lateral electrochemical etching of iii-nitride materials for microfabrication

Assignee: UNIV YALEPriority: Jun 28, 2012Filed: Jan 26, 2017Published: May 11, 2017
Est. expiryJun 28, 2032(~5.9 yrs left)· nominal 20-yr term from priority
Inventors:Jung Han
H10P 50/646H10P 50/617H10P 50/00H01S 5/18363H01S 5/187H01S 5/34333H01S 5/18341H10H 20/8142H10H 20/0137B82Y 20/00H01S 5/18369H01S 5/343
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Claims

Abstract

Conductivity-selective lateral etching of III-nitride materials is described. Methods and structures for making vertical cavity surface emitting lasers with distributed Bragg reflectors via electrochemical etching are described. Layer-selective, lateral electrochemical etching of multi-layer stacks is employed to form semiconductor/air DBR structures adjacent active multiple quantum well regions of the lasers. The electrochemical etching techniques are suitable for high-volume production of lasers and other III-nitride devices, such as lasers, HEMT transistors, power transistors, MEMs structures, and LEDs.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A III-nitride DBR device comprising:
 a multi-layer structure having first and second layers formed of III-nitride material, wherein a conductivity of the first layers is different from a conductivity of the second layers;   a MQW structure formed adjacent the multi-layer structure, wherein the MQW structure comprises an active region of the device;   vias formed into the multi-layer structure proximal to the MQW structure; and   regions adjacent the vias in which portions of the second layers have been completely removed to form at least two first layers separated by one or more layers of air.   
     
     
         2 . The DBR device of  claim 1 , wherein the MQW structure forms an active region of a laser. 
     
     
         3 . The DBR device of  claim 1 , wherein the first layers and second layers comprise GaN. 
     
     
         4 . The DBR device of  claim 3 , wherein the second layers comprise high n-type conductivity material. 
     
     
         5 . The DBR device of  claim 1 , wherein the thicknesses of the first layers are substantially the same. 
     
     
         6 . The DBR device of  claim 1 , wherein the thicknesses of the first layers correspond to approximately one-quarter of a selected emission wavelength for the laser. 
     
     
         7 . The DBR device of  claim 1 , wherein the removed portions of the second layers and remaining first layers form a structure having periodic contrast of optical refractive index.

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