US2017117150A1PendingUtilityA1

Semiconductor device

Assignee: UNITED MICROELECTRONICS CORPPriority: Jul 22, 2015Filed: Jan 8, 2017Published: Apr 27, 2017
Est. expiryJul 22, 2035(~9 yrs left)· nominal 20-yr term from priority
H10P 50/695H10P 50/73H10W 20/089H10P 76/4085H01L 21/0337H01L 21/3086H10D 64/018H10D 62/117
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Claims

Abstract

A semiconductor device includes a hard mask layer and a plurality of spacers. The hard mask layer is disposed on a target layer and has a first material and a second material. The spacers are disposed on the hard mask layer, wherein a first portion of the spacers is disposed on the first material, and a second portion of the spacers is disposed on the second material.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A semiconductor device, comprising:
 a hard mask layer, disposed on a target layer and comprising a first material and a second material; and   a plurality of spacers, disposed on the hard mask layer, wherein a first portion of the spacers is disposed on the first material, and a second portion of the spacers is disposed on the second material.   
     
     
         2 . The semiconductor device according to  claim 1 , wherein the first material is level with the second material. 
     
     
         3 . The semiconductor device according to  claim 1 , wherein the second material comprises a plurality of units separated from each other, and a portion of the spacers is disposed on the units respectively. 
     
     
         4 . The semiconductor device according to  claim 1 , wherein the spacers comprise tungsten, tantalum nitride, titanium nitride or titanium dioxide. 
     
     
         5 . The semiconductor device according to  claim 1 , wherein the target layer comprises semiconductor material, conductive material or non-conductive material.

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