Stacked fan-out package structure
Abstract
A semiconductor package structure is provided. The structure includes a first semiconductor die having a first surface and a second surface opposite thereto. A first molding compound surrounds the first semiconductor die. A first redistribution layer (RDL) structure is disposed on the second surface of the first semiconductor die and laterally extends on the first molding compound. A second semiconductor die is disposed on the first RDL structure and has a first surface and a second surface opposite thereto. A second molding compound surrounds the second semiconductor die. A first protective layer covers a sidewall of the first RDL structure and a sidewall of the first molding compound.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A semiconductor package structure, comprising:
a first semiconductor die having a first surface and a second surface opposite thereto; a first molding compound surrounding the first semiconductor die; a first redistribution layer (RDL) structure disposed on the second surface of the first semiconductor die and laterally extending on the first molding compound; a second semiconductor die disposed on the first RDL structure and having a first surface and a second surface opposite thereto; a second molding compound surrounding the second semiconductor die; and a first protective layer covering a sidewall of the first RDL structure and a sidewall of the first molding compound.
2 . The semiconductor package structure as claimed in claim 1 , wherein the first protective layer is an extending portion of the second molding compound.
3 . The semiconductor package structure as claimed in claim 1 , further comprising a second RDL structure that is disposed on the second surface of the second semiconductor die and laterally extends on the second molding compound.
4 . The semiconductor package structure as claimed in claim 3 , wherein a sidewall of the second RDL structure is not vertically aligned with the sidewall of the first RDL structure.
5 . The semiconductor package structure as claimed in claim 3 , further comprising:
a plurality of bumps disposed on and electrically coupled to the second RDL structure; and a plurality of through vias passing through the second molding compound and electrically coupled between the first RDL structure and the second RDL structure.
6 . The semiconductor package structure as claimed in claim 3 , further comprising:
a third semiconductor die disposed on the second RDL structure and having a first surface and a second surface opposite thereto; and a third molding compound surrounding the third semiconductor die.
7 . The semiconductor package structure as claimed in claim 6 , wherein the first protective layer covering a sidewall of the second RDL structure and a sidewall of the second molding compound.
8 . The semiconductor package structure as claimed in claim 7 , wherein the first protective layer is an extending portion of the third molding compound.
9 . The semiconductor package structure as claimed in claim 6 , further comprising a second protective layer covering a sidewall of the second RDL structure, a sidewall of the second molding compound, and a sidewall of the first protective layer.
10 . The semiconductor package structure as claimed in claim 9 , wherein the first protective layer is an extending portion of the second molding compound and the second protective layer is an extending portion of the third molding compound.
11 . The semiconductor package structure as claimed in claim 9 , further comprising a third RDL structure disposed on the second surface of the third semiconductor die and laterally extending on the third molding compound.
12 . The semiconductor package structure as claimed in claim 11 , wherein a sidewall of the third RDL structure is not vertically aligned with the sidewall of the first RDL structure or the sidewall of the second RDL structure.
13 . The semiconductor package structure as claimed in claim 12 , further comprising:
a plurality of bumps disposed on and electrically coupled to the third RDL structure; and a plurality of through vias passing through the third molding compound and electrically coupled between the second RDL structure and the third RDL structure.
14 . The semiconductor package structure as claimed in claim 6 , further comprising a second protective layer covering a sidewall of the second RDL structure and disposed on the second molding compound.
15 . The semiconductor package structure as claimed in claim 14 , wherein the first protective layer is an extending portion of the second molding compound and the second protective layer is an extending portion of the third molding compound.
16 . The semiconductor package structure as claimed in claim 14 , further comprising a third RDL structure disposed on the second surface of the third semiconductor die and laterally extending on the third molding compound.
17 . The semiconductor package structure as claimed in claim 16 , wherein a sidewall of the third RDL structure is not vertically aligned with the sidewall of the first RDL structure or the sidewall of the second RDL structure.
18 . The semiconductor package structure as claimed in claim 16 , further comprising:
a plurality of bumps disposed on and electrically coupled to the third RDL structure; and a plurality of through vias passing through the third molding compound and electrically coupled between the second RDL structure and the third RDL structure.
19 . The semiconductor package structure as claimed in claim 1 , further comprising a backside film disposed on the first surface of the first semiconductor die.
20 . A semiconductor package structure, comprising:
a first semiconductor die having a first surface and a second surface opposite thereto; a first RDL structure disposed on the second surface of the first semiconductor die; a second semiconductor die disposed on the first RDL structure and having a first surface and a second surface opposite thereto, wherein the second semiconductor die has smaller dimensions than the first semiconductor die, so that a portion of the first RDL structure is exposed from the second semiconductor die; and a second molding compound disposed on the exposed portion of the first RDL structure and surrounding the second semiconductor die, wherein the second molding compound has an extending portion covering a sidewall of the first RDL structure.
21 . The semiconductor package structure as claimed in claim 20 , wherein the extending portion of the second molding compound partially covers a sidewall of the first semiconductor die.
22 . The semiconductor package structure as claimed in claim 20 , wherein the extending portion of the second molding compound entirely covers a sidewall of the first semiconductor die.
23 . The semiconductor package structure as claimed in claim 20 , further comprising a second RDL structure disposed on the second surface of the second semiconductor die and laterally extending on the second molding compound.
24 . The semiconductor package structure as claimed in claim 23 , wherein a sidewall of the second RDL structure is not vertically aligned with the sidewall of the first RDL structure.
25 . The semiconductor package structure as claimed in claim 23 , further comprising:
a plurality of bumps disposed on and electrically coupled to the second RDL structure; and a plurality of through vias passing through the second molding compound and electrically coupled between the first RDL structure and the second RDL structure.
26 . The semiconductor package structure as claimed in claim 20 , further comprising a backside film disposed on the first surface of the first semiconductor die.Join the waitlist — get patent alerts
Track US2017098629A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.