US2017040287A1PendingUtilityA1

Electronic component device production method and electronic component sealing sheet

Assignee: NITTO DENKO CORPPriority: Dec 26, 2013Filed: Dec 22, 2014Published: Feb 9, 2017
Est. expiryDec 26, 2033(~7.4 yrs left)· nominal 20-yr term from priority
H10W 74/00H10W 74/142H10P 54/00H10W 74/111H10W 72/241H10W 72/20H10W 74/47H10W 74/019H10W 74/014H10W 74/01H10W 70/09H10W 72/0198H01L 23/293H01L 23/3107H01L 21/561C08J 5/18H01L 2224/12105C08J 2433/10C08J 2363/02C08J 2461/06B32B 27/36B32B 7/10H01L 24/96H01L 21/568B29K 2667/003B32B 2457/14B29C 65/02H01L 21/78H01L 24/13B32B 27/08B32B 37/06B32B 37/182H01L 2924/0665B32B 7/12B32B 2307/20B32B 37/185B32B 2367/00B32B 25/08B32B 27/38B32B 2307/536B32B 5/20C09K 3/10B32B 2307/51B32B 2309/105B32B 2255/26B32B 2255/10B32B 25/12B32B 37/187B32B 2309/04B32B 27/42B32B 15/06B32B 27/065B32B 5/18B32B 3/08B32B 15/046B32B 2309/02B32B 27/26B29L 2031/3481H10W 74/10H10W 74/40
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Claims

Abstract

The electronic component device production method includes a step A of preparing a layered body comprising electronic components immobilized on a support body, a step B of preparing an electronic component sealing sheet, a step C of disposing the electronic component sealing sheet over the electronic components under conditions where the probe tack force of the electronic component sealing sheet is 5 gf or lower according to a probe tack test, a step D of rising the temperature of the electronic component sealing sheet until the probe tack of the electronic component sealing sheet is 10 gf or greater according to the probe tack test to immobilize temporarily the electronic component sealing sheet onto the electronic components, and a step E of embedding the electronic components in the electronic component sealing sheet to form a sealed body comprising the electronic components embedded in the electronic component sealing sheet.

Claims

exact text as granted — not AI-modified
1 . A method for manufacturing an electronic component device, comprising:
 a step A of preparing a laminate in which electronic components are fixed on a support,   a step B of preparing a sheet for sealing an electronic component,   a step C of arranging the sheet for sealing an electronic component on the electronic components under a condition in which the probe tack force of the sheet for sealing an electronic component in a probe tack test is 5 gf or less,   a step D of increasing a temperature of the sheet for sealing an electronic component in a state where the sheet for sealing an electronic component is arranged on the electronic components until the probe tack force of the sheet for sealing an electronic component in a probe tack test becomes 10 gf or more and temporarily fixing the sheet for sealing an electronic component to the electronic components, and   a step E of embedding the electronic components in the sheet for sealing an electronic component to forma sealed body in which the electronic components are embedded in the sheet for sealing an electronic component.   
     
     
         2 . The method for manufacturing an electronic component device according to  claim 1 , wherein the probe tack force of the sheet for sealing an electronic component in a probe tack test is 5 gf or less at 25° C., and 10 gf or more at 40° C. 
     
     
         3 . The method for manufacturing an electronic component device according to  claim 2 , wherein
 the step C is a step of arranging the sheet for sealing an electronic component on the electronic components at 25° C. or lower, and   the step D is a step of increasing a temperature of the sheet for sealing an electronic component to 40° C. or higher and temporarily fixing the sheet for sealing an electronic component to the electronic components.   
     
     
         4 . A sheet for sealing an electronic component having a probe tack force in a probe tack test of 5 gf or less at 25° C. and 10 gf or more at 40° C.

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