US2016335387A1PendingUtilityA1

Design Tools For Converting a FinFet Circuit into a Circuit Including Nanowires and 2D Material Strips

Assignee: SYNOPSYS INCPriority: Jun 23, 2014Filed: Jul 28, 2016Published: Nov 17, 2016
Est. expiryJun 23, 2034(~7.9 yrs left)· nominal 20-yr term from priority
G06F 2111/14G06F 30/39G06F 30/392B82Y 10/00H10D 86/215H10D 84/853H10D 84/0195H10D 84/0167H10D 84/038H10D 89/10H10D 86/201H10D 86/01H10D 84/85H10D 62/122H10D 62/121H10D 30/6735H10D 30/63H10D 30/43H10D 30/6728H10D 86/60H10D 86/40G06F 17/5072G06F 17/5077H10B 10/12
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Claims

Abstract

An integrated circuit design tool includes a cell library. An entry in the cell library comprises a specification of the cell including a first transistor and a second transistor. The first transistor can include a first set of nanowires or 2D material strips arranged in parallel to form a channel structure, and a gate conductor disposed across the first set of nanowires or 2D material strips. The second transistor can include a second set of nanowires or 2D material strips arranged in parallel to form a channel structure, and a gate conductor disposed across the first set of nanowires or 2D material strips. The number of nanowires or 2D material strips in the first set can be different from the number of nanowires or 2D material strips in the second set, so that the drive power of the individual transistors can be set with finer granularity.

Claims

exact text as granted — not AI-modified
1 . A method for designing a circuit, comprising:
 converting a circuit having a particular transistor having a channel comprising a plurality of fins configured in parallel into a converted circuit, the converted circuit replacing the particular transistor with a converted transistor having a channel comprising a stacked channel including plurality of stacks arranged in parallel.   
     
     
         2 . The method of  claim 1 , wherein the particular transistor is an n-channel transistor, and the circuit includes in addition a p-channel transistor comprising a second plurality of fins, the second plurality of fins having a different number of fins than the plurality of fins in the particular transistor, and the converted circuit replacing the p-channel transistor with a transistor having a stacked channel comprising a second plurality of stacks arranged in parallel, wherein the stacked channel of the p-channel transistor has as different number of layers than the particular transistor. 
     
     
         3 . The method of  claim 2 , wherein the p-channel transistor has a same number of stacks as the particular transistor. 
     
     
         4 . The method of  claim 1 , including:
 creating a machine readable specification of a cell including the converted circuit; and   storing the machine readable specification in computer readable memory.   
     
     
         5 . The method of  claim 4 , including extracting physical characteristics of the converted circuit, and wherein the machine readable specification includes the extracted physical characteristics. 
     
     
         6 . A method for designing a circuit, comprising:
 converting a circuit having a particular transistor having a channel comprising a plurality of fins configured in parallel into a converted circuit, the converted circuit replacing the particular transistor with a converted transistor having a channel comprising a plurality of stacks of nanowires arranged in parallel.   
     
     
         7 . The method of  claim 6 , wherein the particular transistor is an n-channel transistor, and the circuit includes in addition a p-channel transistor comprising a second plurality of fins, the second plurality of fins having a different number of fins than the plurality of fins in the particular transistor, and the converted circuit replacing the p-channel transistor with a transistor having a channel comprising a second plurality of stacks of nanowires arranged in parallel, wherein the channel of the p-channel transistor has as different number of nanowires than the particular transistor. 
     
     
         8 . The method of  claim 7 , wherein the p-channel transistor has a same number of stacks of nanowires as the particular transistor. 
     
     
         9 . The method of  claim 6 , including:
 creating a machine readable specification of a cell including the converted circuit; and   storing the machine readable specification in computer readable memory.   
     
     
         10 . The method of  claim 9 , including extracting physical characteristics of the converted circuit, and wherein the machine readable specification includes the extracted physical characteristics. 
     
     
         11 . A method for designing a circuit, comprising:
 converting a circuit having a particular transistor having a channel comprising a plurality of fins configured in parallel into a converted circuit, the converted circuit replacing the particular transistor with a converted transistor having a channel comprising a plurality of stacks of 2D material strips arranged in parallel.   
     
     
         12 . The method of  claim 11 , wherein the particular transistor is an n-channel transistor, and the circuit includes in addition a p-channel transistor comprising a second plurality of fins, the second plurality of fins having a different number of fins than the plurality of fins in the particular transistor, and the converted circuit replacing the p-channel transistor with a transistor having a channel comprising a second plurality of stacks of 2D material strips arranged in parallel, wherein the channel of the p-channel transistor has as different number of 2D material strips than the particular transistor. 
     
     
         13 . The method of  claim 12 , wherein the p-channel transistor has a same number of stacks of 2D material strips as the particular transistor. 
     
     
         14 . The method of  claim 11 , including:
 creating a machine readable specification of a cell including the converted circuit; and   storing the machine readable specification in computer readable memory.   
     
     
         15 . The method of  claim 14 , including extracting physical characteristics of the converted circuit, and wherein the machine readable specification includes the extracted physical characteristics.

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