US2016322296A1PendingUtilityA1

Package substrates, semiconductor packages having the package substrates, and methods for fabricating the semiconductor packages

Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Aug 30, 2012Filed: Jul 14, 2016Published: Nov 3, 2016
Est. expiryAug 30, 2032(~6.1 yrs left)· nominal 20-yr term from priority
H10W 72/5522H10W 90/754H10W 90/724H10W 72/252H10W 90/701H10W 74/129H10W 74/016H10W 70/635H10W 70/095H10W 70/093H10W 70/69H10W 20/20H10W 72/00H10W 70/699H10W 70/60H01L 23/49811H01L 21/4853H01L 21/565H01L 21/486H01L 23/3114H01L 23/49827H01L 23/49855
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Claims

Abstract

Package substrates, semiconductor packages including the package substrates, and methods for fabricating the semiconductor packages are provided. A package substrate may include a core including a first surface on which a semiconductor chip is disposed and a second surface opposite the first surface. The package substrate may also include a metal pad on the second surface of the core. The metal pad may include a saline water corrosion resistant surface.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A method of fabricating a semiconductor package, the method comprising:
 providing a core comprising a first surface and a second surface opposite the first surface;   forming a through hole penetrating through the core;   forming a metal pad on the first surface of the core;   treating a surface of the metal pad to form a saline water corrosion resistant surface;   mounting a semiconductor chip on the second surface of the core and electrically connected to the metal pad; and   forming a molding layer on the second surface of the core encapsulating the semiconductor chip.   
     
     
         2 . A semiconductor package comprising:
 a package substrate comprising a core including a through hole, an aluminum pad on   a first surface of the core, and an anti-corrosion layer on the aluminum pad;   a semiconductor chip on a second surface of the core opposite the first surface of the core and electrically connected to the aluminum pad by a bonding wire, the bonding wire passing through the through hole; and   a molding layer encapsulating the semiconductor chip, wherein the anti-corrosion layer has a corrosion resistance to saline water.

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