Color-treated base material and base material color treatment method therefor
Abstract
This color-treated base material, which comprises a matrix comprising magnesium, a film formed on the matrix and containing a compound represented by chemical formula 1, and a wavelength conversion layer formed on the film, can improve the durability of the base material while maintaining the unique metal texture and gloss of the base material and can uniformly realize various colors, such as blue and green, including an achromatic color such as black, on the surface of the base material and thus can be usefully used in the fields of building exterior materials, automobile interiors, and particularly electrical/electronic component materials, such as mobile product frames, in which a metal material is used.
Claims
exact text as granted — not AI-modified1 . A color-treated substrate, comprising:
a matrix containing magnesium; a film formed on the matrix and containing a compound represented by the following Chemical Formula 1; and a wavelength conversion layer formed on the film:
M(OH) m [Chemical Formula 1]
where M includes one or more selected from the group consisting of Na, K, Mg, Ca and Ba, and m is 1 or 2, wherein a condition of the following Expression 1 is satisfied with respect to an arbitrary point A existing on the wavelength conversion layer:
0.1≦ T film /T ML ≦10 [Expression 1]
where T film represents an average thickness of the film at the point A, T ML represents an average thickness of the wavelength conversion layer at the point A.
2 . The color-treated substrate according to claim 1 , wherein an average thickness of the wavelength conversion layer is 200 nm or less.
3 . The color-treated substrate according to claim 1 , wherein, when an average thickness ratio T film /T ML of the film to the wavelength conversion layer is in a range of 0.1 to 6.0 and an average thickness of the film is less than 80 nm at the arbitrary point A existing on the wavelength conversion layer, L* is 60 or less in a CIE average color coordinate of any three points included in an arbitrary area with a width of 1 cm and length of 1 cm existing on the wavelength conversion layer.
4 . The color-treated substrate according to claim 1 , wherein, when an average thickness ratio T film /T ML of the film to the wavelength conversion layer is in a range of 0.2 to 4.0 and an average thickness of the film is in a range of 80 to 140 nm at the arbitrary point A existing on the wavelength conversion layer, L* is more than 60 and b* is less than 5 in CIE average color coordinates of any three points included in an arbitrary area with a width of 1 cm and length of 1 cm existing on the wavelength conversion layer.
5 . The color-treated substrate according to claim 1 , wherein, when an average thickness ratio T film /T ML of the film to the wavelength conversion layer is in a range of 0.7 to 8.5 and an average thickness of the film is more than 140 nm and 300 nm or less at the arbitrary point A existing on the wavelength conversion layer, L* is more than 60, a* is −5 or less and b* is 5 or more in CIE average color coordinates of any three points included in an arbitrary area with a width of 1 cm and length of 1 cm existing on the wavelength conversion layer.
6 . The color-treated substrate according to claim 1 , wherein the film includes magnesium hydroxide (Mg(OH) 2 ).
7 . The color-treated substrate according to claim 1 , wherein the wavelength conversion layer includes one or more selected from the group consisting of metals including aluminum (Al), chromium (Cr), titanium (Ti), gold (Au), molybdenum (Mo), silver (Ag), manganese (Mn), zirconium (Zr), palladium (Pd), platinum (Pt), cobalt (Co), cadmium (Cd) or copper (Cu) and ions thereof.
8 . The color-treated substrate according to claim 1 , wherein the matrix further includes stainless steel or titanium (Ti).
9 . A method of color-treating a substrate, comprising:
a step of forming a film on a matrix containing magnesium; and a step of forming a wavelength conversion layer on the film, wherein a condition of the following Expression 1 is satisfied with respect to an arbitrary point A existing on the wavelength conversion layer:
0.1≦ T film /T ML ≦10 [Expression 1]
where T film represents an average thickness of the film at the point A, T ML represents an average thickness of the wavelength conversion layer at the point A.
10 . The method according to claim 9 , wherein the film is formed by immersing the matrix containing magnesium in a hydroxide solution in the step of forming the film.
11 . The method according to claim 10 , wherein a temperature of the hydroxide solution is in a range of 90 to 200° C., and immersion time is 20 minutes or less.
12 . The method according to claim 10 , wherein the hydroxide solution includes one or more selected from the group consisting of NaOH, KOH, Mg(OH) 2 , Ca(OH) 2 and Ba(OH) 2 .
13 . The method according to claim 10 , wherein a concentration of the hydroxide solution is in a range of 1 to 80 wt %.Join the waitlist — get patent alerts
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