US2016308078A1PendingUtilityA1
Method of etching a semiconductor layer of a photovoltaic device
Est. expirySep 19, 2031(~5.2 yrs left)· nominal 20-yr term from priority
H10F 77/1662H10F 77/1265H10F 77/1233H10F 77/1223H10F 77/219H10F 77/211H10F 77/166H10F 77/123H10F 71/10H10F 10/167H10F 10/164H10F 10/162H10F 77/703H01L 31/03762H01L 31/074H01L 31/0323H01L 31/022441H01L 31/0288H01L 31/073H01L 31/02963H01L 31/0749H01L 31/02363Y02E10/541Y02E10/50Y02E10/548Y02E10/543Y02P70/50
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Claims
Abstract
A method and apparatus provide for a roughened back surface of a semiconductor absorber layer of a photovoltaic device to improve adhesion. The roughened back surface may be achieved through an etching process.
Claims
exact text as granted — not AI-modified1 - 26 . (canceled)
27 . A photovoltaic device comprising:
a window layer; an absorber layer forded over the window layer, the absorber layer having a back surface, wherein the back surface has a roughness mean value of about 10 nm or greater; and a conductive material formed in contact with the back surface of the absorber layer.
28 . The device of claim 27 , wherein at least a portion of the back surface of the absorber layer is etched to achieve a roughness mean value of about 10 nm or greater.
29 . The device of claim 27 , wherein the absorber layer is selected from the group consisting of: CIGS, CdTe, and amorphous Si.
30 . The device of claim 27 , wherein the absorber layer comprises CdCl2-treated CdTe.
31 . The device of claim 30 , wherein the absorber layer is heated in the range of about 380° C. to about 450° C.
32 . The device of claim 27 , wherein the window layer is selected from the group consisting of ZnO, ZnS, ZnSe, ZnTe, CdO, CdS, CdSe, CdTe, MgO, MgS, MgSe, MgTe, HgO, HgS, HgSe, HgTe, AlN, AlP, AlAs, AlSb, GaN, GaP, GaAs, GaSb, InS, InN, InP, InAs, InSb, TIN, TIP, TIAs, TlSb, and mixtures thereof.
33 . The device of claim 27 , wherein the conductive material is selected from the group consisting of metallic silver, nickel, copper, aluminum, titanium, palladium, chrome and molybdenum.
34 . The device of claim 27 , wherein the absorber layer is doped with a with a p-type dopant.
35 . The device of claim 34 , wherein the p-type dopant is selected from the group consisting of Li, Na, K, Rb, Cs, Cu, Ag, Au, N, P, As, Sb, and Bi.Join the waitlist — get patent alerts
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