US2016282994A1PendingUtilityA1

Capacitance sensor with sensor capacitance compensation

Assignee: CYPRESS SEMICONDUCTOR CORPPriority: Feb 27, 2008Filed: Mar 31, 2016Published: Sep 29, 2016
Est. expiryFeb 27, 2028(~1.6 yrs left)· nominal 20-yr term from priority
G06F 3/044G06F 3/0416G06F 3/04182H03K 17/9622H03K 2217/960725
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Claims

Abstract

A capacitance sensing circuit may include a switching circuit configured to generate a sensor current by charging and discharging a capacitive sensor electrode, and a current mirror that generates a mirror current based on the sensor current. Based on the mirror current, a measurement circuit generates an output signal representative of a capacitance of the capacitive sensor electrode.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . An integrated circuit (IC) comprising:
 a terminal configured to be coupled to a capacitive sensor element;   a switching circuit coupled between the terminal and a compensation circuit;   a current mirror having an input coupled to the switching circuit and the compensation circuit, and an output coupled to a first input of a comparator; and   wherein the switching circuit is configured to couple the terminal to a first supply voltage in a first state and to the compensation circuit and the current mirror in a second state.   
     
     
         2 . The IC of  claim 1 , wherein the compensation circuit is coupled between the switching circuit and a second power supply voltage. 
     
     
         3 . The IC of  claim 1 , wherein the first supply voltage is a ground voltage. 
     
     
         4 . The IC of  claim 2 , wherein the second supply voltage is a positive voltage. 
     
     
         5 . The IC of  claim 2 , wherein the first supply voltage is a positive voltage and the second supply voltage is a ground voltage. 
     
     
         6 . The IC of  claim 1 , further comprising a timer circuit coupled to the output of the comparator and clocked by an oscillator. 
     
     
         7 . The IC of  claim 1 , wherein the capacitance of the capacitive sensor element is affected by the proximity of a conductive object. 
     
     
         8 . The IC of  claim 1 , further comprising a processing core coupled to the comparator and a communication block coupled to the processing core, wherein the communication block is configured to communicate with a host processor. 
     
     
         9 . The IC of  claim 1 , wherein the compensation circuit comprises a current digital-to-analog-converter. 
     
     
         10 . A method comprising:
 providing a terminal configured to be coupled to a capacitive sensor element;   providing a compensation circuit;   providing a switching circuit coupled between the terminal and the compensation circuit;   providing a current mirror having an input coupled to the switching circuit and to the compensation circuit;   providing a comparator having a first input coupled to the output of the current mirror;   configuring the terminal to be coupled to a first supply voltage using the switching circuit in a first state; and   configuring the terminal to be coupled to the compensation circuit and current mirror using the switching circuit in a second state.   
     
     
         11 . The method of  claim 10 , further comprising configuring the compensation circuit to be coupled to a second power supply voltage. 
     
     
         12 . The method of  claim 10 , wherein the first supply voltage is a ground voltage, 
     
     
         13 . The method of  claim 11 , wherein the second supply voltage is a positive voltage. 
     
     
         14 . The method of  claim 11 , wherein the first supply voltage is a positive voltage and the second supply voltage is a ground voltage. 
     
     
         15 . The method of  claim 10 , wherein the capacitance of the capacitive sensor element is affected by the proximity of a conductive object. 
     
     
         16 . The method of  claim 10 , further comprising:
 providing a processing core coupled to the comparator;   providing a communication block coupled to the processing core; and   configuring the communication block to communicate with a host processor.   
     
     
         17 . A system comprising:
 a capacitive sensor element;   a switching circuit coupled between the capacitive sensor element and a compensation circuit;   a current mirror having an input coupled to the switching circuit and the compensation circuit, and an output coupled to a first input of a comparator;   a processing core coupled to an output of the comparator;   a communication block coupled to the processing core; and   a host processor coupled to the communication block,   wherein the switching circuit is configured to couple the input terminal to a first supply voltage in a first state and to the compensation circuit and current mirror in a second state, and wherein the compensation circuit is coupled between the switching circuit and a second power supply voltage.   
     
     
         18 . The system of  claim 17 , wherein the first supply voltage is a ground voltage and the second supply voltage is a positive voltage. 
     
     
         19 . The system of  claim 17 , wherein the second supply voltage is a ground voltage and the first supply voltage is a positive voltage. 
     
     
         20 . The system of  claim 17 , wherein the compensation circuit comprises a current digital-to-analog-converter.

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