Method and system to tolerance test a component
Abstract
A method and system of tolerance testing a component using data measurements from a single test setup within a test apparatus are described. The method includes receiving the data measurements obtained with the single test setup. The method also includes separating, at the processor, the data measurements from a relative positioning of an element of the test apparatus and performing, at the processor, a virtual setup of the component to obtain additional data measurements related to one or more parts of the component. The method additionally includes determining, at the processor, whether a parameter associated with the one or more parts meets a specified tolerance based on the additional data measurements obtained from the virtual setup.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of tolerance testing a component using data measurements from a single test setup within a test apparatus, the method comprising:
receiving, at a processor, the data measurements obtained with the single test setup; separating, at the processor, the data measurements from a relative positioning of an element of the test apparatus; performing, at the processor, a virtual setup of the component to obtain additional data measurements related to one or more parts of the component; and determining, at the processor, whether a parameter associated with the one or more parts meets a specified tolerance based on the additional data measurements obtained from the virtual setup.
2 . The method according to claim 1 , further comprising plotting the data measurements on a three-dimensional coordinate system referenced to the element of the test apparatus.
3 . The method according to claim 2 , wherein the plotting the data measurements includes plotting best-fit circles based on the data measurements along an axial length of the component.
4 . The method according to claim 2 , wherein the plotting the data measurements includes plotting best-fit planes based on the data measurements on a set of planes perpendicular to an axial length of the component.
5 . The method according to claim 2 , further comprising determining an axis through the component based on the plotting the data measurements.
6 . The method according to claim 5 , wherein the performing the virtual setup includes shifting the axis through the component such that the one or more parts are located on an axis of the three-dimensional coordinate system.
7 . The method according to claim 1 , wherein the parameter is circularity.
8 . The method according to claim 1 , wherein the additional data measurements are related to two or more parts and the parameter is eccentricity.
9 . The method according to claim 1 , further comprising modifying the component when the parameter is determined to not meet the specified tolerance.Join the waitlist — get patent alerts
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