US2016245647A1PendingUtilityA1

Method and system to tolerance test a component

Assignee: GEN ELECTRICPriority: Jul 3, 2013Filed: May 4, 2016Published: Aug 25, 2016
Est. expiryJul 3, 2033(~7 yrs left)· nominal 20-yr term from priority
G01B 21/047G01M 13/00G01M 13/025G01B 11/2504G01N 21/9515G01B 11/25G06F 11/263
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Claims

Abstract

A method and system of tolerance testing a component using data measurements from a single test setup within a test apparatus are described. The method includes receiving the data measurements obtained with the single test setup. The method also includes separating, at the processor, the data measurements from a relative positioning of an element of the test apparatus and performing, at the processor, a virtual setup of the component to obtain additional data measurements related to one or more parts of the component. The method additionally includes determining, at the processor, whether a parameter associated with the one or more parts meets a specified tolerance based on the additional data measurements obtained from the virtual setup.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A method of tolerance testing a component using data measurements from a single test setup within a test apparatus, the method comprising:
 receiving, at a processor, the data measurements obtained with the single test setup;   separating, at the processor, the data measurements from a relative positioning of an element of the test apparatus;   performing, at the processor, a virtual setup of the component to obtain additional data measurements related to one or more parts of the component; and   determining, at the processor, whether a parameter associated with the one or more parts meets a specified tolerance based on the additional data measurements obtained from the virtual setup.   
     
     
         2 . The method according to  claim 1 , further comprising plotting the data measurements on a three-dimensional coordinate system referenced to the element of the test apparatus. 
     
     
         3 . The method according to  claim 2 , wherein the plotting the data measurements includes plotting best-fit circles based on the data measurements along an axial length of the component. 
     
     
         4 . The method according to  claim 2 , wherein the plotting the data measurements includes plotting best-fit planes based on the data measurements on a set of planes perpendicular to an axial length of the component. 
     
     
         5 . The method according to  claim 2 , further comprising determining an axis through the component based on the plotting the data measurements. 
     
     
         6 . The method according to  claim 5 , wherein the performing the virtual setup includes shifting the axis through the component such that the one or more parts are located on an axis of the three-dimensional coordinate system. 
     
     
         7 . The method according to  claim 1 , wherein the parameter is circularity. 
     
     
         8 . The method according to  claim 1 , wherein the additional data measurements are related to two or more parts and the parameter is eccentricity. 
     
     
         9 . The method according to  claim 1 , further comprising modifying the component when the parameter is determined to not meet the specified tolerance.

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