US2016243670A1PendingUtilityA1
Retainer ring, substrate holding apparatus, and polishing apparatus, and retainer ring maintenance method
Est. expiryFeb 24, 2035(~8.6 yrs left)· nominal 20-yr term from priority
B24B 37/32
44
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Claims
Abstract
According to one embodiment, a retainer ring for retaining a substrate to be polished, includes: an inside ring arranged to enclose the substrate; and an outside ring arranged outside the inside ring, abrasion-resistant of the outside ring being higher than abrasion-resistant of the inside ring, wherein the inside ring having a thickness in a radial direction in a range from a minimum of 0.05 mm to a maximum of 5 mm.
Claims
exact text as granted — not AI-modified1 . A retainer ring for retaining a substrate to be polished, the retainer ring comprising:
an inside ring arranged to enclose the substrate; and an outside ring arranged outside the inside ring, abrasion-resistant of the outside ring being higher than abrasion-resistant of the inside ring, wherein the inside ring having a thickness in a radial direction in a range from a minimum of 0.05 mm to a maximum of 5 mm.
2 . The retainer ring according to claim 1 , wherein a convex portion toward the polishing pad is formed on a lower surface of the outside ring.
3 . The retainer ring according to claim 2 , wherein a distance between a tip of the convex portion and an end of the outside ring with no convex portion is below 30 μm.
4 . The retainer ring according to claim 1 , wherein the inside ring is detachably attached to the outside ring.
5 . The retainer ring according to claim 1 , wherein a material of the inside ring includes one or more of PPS, PEEK, PTFE, PP, PET, polycarbonate, and polyacetal.
6 . The retainer ring according to claim 1 , wherein a material of the outside ring includes one or more of ceramic materials and metallic materials.
7 . The retainer ring according to claim 1 , wherein surface roughness of a lower surface of the outside ring is a maximum of Ra 1.6 μm.
8 . The retainer ring according to claim 1 , wherein Rockwell M hardness of the inside ring is in a range from a minimum of 70 to a maximum of 120.
9 . The retainer ring according to claim 1 , wherein on a lower surface of the inside ring and a lower surface of the outside ring, a plurality of grooves extending in radial directions and communicating the inside ring and the outside ring are formed.
10 . A substrate holding apparatus comprising:
a top ring body for holding a substrate; and the retainer ring according to claim 1 , the retainer ring being arranged to enclose the substrate held by the top ring body.
11 . A polishing apparatus comprising:
a polishing pad; and the substrate holding apparatus according to claim 10 , the substrate holding apparatus pressing the substrate onto the polishing pad.
12 . A method for maintaining a retainer ring for retaining a substrate to be polished, the retainer ring comprising:
an inside ring arranged to enclose the substrate; and an outside ring arranged outside the inside ring, abrasion-resistant of the outside ring being higher than abrasion-resistant of the inside ring, wherein the inside ring having a thickness in a radial direction in a range from a minimum of 0.05 mm to a maximum of 5 mm, and wherein the inside ring is detachably attached to the outside ring, the method comprising: removing the inside ring from the outside ring; and fixing a new inside ring onto the outside ring.
13 . A retainer ring for retaining a substrate to be polished, the retainer ring comprising:
an inside ring arranged to enclose the substrate; and an outside ring arranged outside the inside ring, the outside ring comprising a lower ring and an upper ring, wherein abrasion-resistant of the lower ring is higher than abrasion-resistant of the inside ring, and toughness of the upper ring is higher than toughness of the lower ring.
14 . The retainer ring according to claim 13 , wherein a convex portion toward the polishing pad is formed on a lower surface of the outside ring.
15 . The retainer ring according to claim 14 , wherein a distance between a tip of the convex portion and an end of the outside ring with no convex portion is below 30 μm.
16 . The retainer ring according to claim 13 , wherein the inside ring is detachably attached to the outside ring.
17 . The retainer ring according to claim 13 , wherein a material of the inside ring includes one or more of PPS, PEEK, PTFE, PP, PET, polycarbonate, and polyacetal.
18 . The retainer ring according to claim 13 , wherein a material of the outside ring includes one or more of ceramic materials and metallic materials.
19 . The retainer ring according to claim 19 , wherein surface roughness of a lower surface of the outside ring is a maximum of Ra 1.6 μm.
20 . The retainer ring according to claim 10 , wherein Rockwell M hardness of the inside ring is in a range from a minimum of 70 to a maximum of 120.
21 . The retainer ring according to claim 11 , wherein on a lower surface of the inside ring and a lower surface of the outside ring, a plurality of grooves extending in radial directions and communicating the inside ring and the outside ring are formed.
22 . A retainer ring for retaining a substrate to be polished, the retainer ring comprising:
an inside ring arranged to enclose the substrate; an outside ring arranged outside the inside ring, abrasion-resistant of the outside ring being higher than abrasion-resistant of the inside ring and the outside ring being harder than the inside ring; wherein the outside ring and the inside ring are individually, vertically movable each other, and the outside ring is either contact-less with the polishing pad, or is pressed onto the polishing pad with a force smaller than another force pressing the inside ring onto the polishing pad.
23 . The retainer ring according to claim 22 , wherein a material of the inside ring includes one or more of PPS, PEEK, PTFE, PP, PET, polycarbonate, and polyacetal.
24 . The retainer ring according to claim 22 , wherein a material of the outside ring includes one or more of ceramic materials and metallic materials.
25 . The retainer ring according to claim 22 , wherein surface roughness of a lower surface of the outside ring is a maximum of Ra 1.6 μm.
26 . The retainer ring according to claim 22 , wherein Rockwell M hardness of the inside ring is in a range from a minimum of 70 to a maximum of 120.
27 . The retainer ring according to claim 22 , wherein on a lower surface of the inside ring and a lower surface of the outside ring, a plurality of grooves extending in radial directions and communicating the inside ring and the outside ring are formed.
28 . A substrate holding apparatus comprising:
a top ring body holding a substrate; and the retainer ring according to claim 22 , the retainer ring being arranged to enclose the substrate held by the top ring body.
29 . A polishing apparatus comprising:
a polishing pad; and the substrate holding apparatus according to claim 28 , the substrate holding apparatus pressing the substrate onto the polishing pad.Join the waitlist — get patent alerts
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