Device for monitoring liquid crystal display and method for manufacturing liquid crystal display

Abstract

A device for monitoring a liquid crystal display includes: a substrate including a display region and a non-display region disposed at an edge of the display region. The display region includes: a thin film transistor disposed on the substrate, a pixel electrode disposed on the substrate and connected to the thin film transistor, a first sacrificial layer disposed on the pixel electrode, and a roof layer disposed on the sacrificial layer. The non-display region includes: a second sacrificial layer disposed on the substrate, and the roof layer disposed on the second sacrificial layer. The first sacrificial layer has a first longitudinal dimension and a first cross-sectional area, and the second sacrificial layer has a second longitudinal dimension and a second cross-sectional area. The first cross-sectional area is the same as the second cross-sectional area. The second longitudinal dimension is greater than the first longitudinal dimension.

What is claimed is: 
     
         1 . A device for monitoring a liquid crystal display, comprising:
 a substrate comprising a display region and a non-display region disposed at an edge of the display region,   wherein the display region comprises:
 a thin film transistor disposed on the substrate; 
 a pixel electrode disposed on the substrate and connected to the thin film transistor; 
 a first sacrificial layer disposed on the pixel electrode; and 
 a roof layer disposed on the first sacrificial layer, 
   wherein the non-display region comprises:
 a second sacrificial layer disposed on the substrate; and 
 the roof layer disposed on the second sacrificial layer, and 
   wherein:
 the first sacrificial layer has a first longitudinal dimension and a first cross-sectional area; 
 the second sacrificial layer has a second longitudinal dimension and a second cross-sectional area; 
 the first cross-sectional area and the second cross-sectional area are the same as one another; and 
 the second longitudinal dimension is longer than the first longitudinal dimension. 
   
     
     
         2 . The device for monitoring a liquid crystal display of  claim 1 , wherein:
 the first sacrificial layer is configured to be completely removed over a first processing time; and   in association with a second processing time longer than the first processing time, the second sacrificial layer is configured to facilitate confirmation of the complete removal of the first sacrificial layer and a degree of removal of the second sacrificial layer is determined by monitoring the degree of etching of the second sacrificial layer.   
     
     
         3 . The device for monitoring a liquid crystal display of  claim 2 , wherein the second processing time is at least 150% greater than the first process time. 
     
     
         4 . The device for monitoring a liquid crystal display of  claim 3 , wherein the second sacrifical layer comprises:
 a first section where the degree of etching of the second sacrificial layer ranges from 100% of the first longitudinal dimension to a first upper limit percentage value of the first longitudinal dimension; and   a second section where the degree of etching the second sacrificial layer ranges from the first upper limit percentage value to a second upper limit percentage value of the first longitudinal dimension,   wherein the first upper limit percentage value is greater than 100%, and   wherein the second upper limit percentage value is greater than the first upper limit percentage value.   
     
     
         5 . The device for monitoring a liquid crystal display of  claim 4 , wherein the second sacrificial layer further comprises:
 a third section where the degree of etching of the second sacrificial layer is 100% or less of the first longitudinal dimension.   
     
     
         6 . The device for monitoring a liquid crystal display of  claim 5 , wherein, when the degree of etching at least extends to the first or third sections, the second sacrifical layer is configured to indicate replacement of an initial sacrificial layer removal composition. 
     
     
         7 . The device for monitoring a liquid crystal display of  claim 1 , wherein the peripheral region further comprises:
 a dummy sacrificial layer disposed adjacent to the second sacrificial layer,   wherein the dummy sacrificial layer has the same cross-sectional area as the second sacrificial layer.   
     
     
         8 . The device for monitoring a liquid crystal display of  claim 7 , wherein the second longitudinal dimension is at least 150% greater than the first longitudinal dimension. 
     
     
         9 . The device for monitoring a liquid crystal display of  claim 8 , wherein the second sacrifical layer comprises gradations marked along the second longitudinal dimension to indicate an extent of removal. 
     
     
         10 . The device for monitoring a liquid crystal display of  claim 9 , wherein the gradations are marked on a partition structure disposed adjacent to the second sacrificial layer, the partition structure comprising an insulating layer. 
     
     
         11 . The device for monitoring a liquid crystal display of  claim 1 , wherein:
 the first sacrificial layer is one of a plurality of first sacrificial layers in a pattern of first sacrificial layers disposed in a pixel region of the liquid crystal display;   the second sacrificial layer is one of a plurality of second sacrificial layers in a pattern of second sacrificial layers; and   a separation distance between ones of the plurality of first sacrificial layers is the same as a separation distance between ones of the plurality of second sacrificial layers.