US2016181387A1PendingUtilityA1
Thin film transistor and organic light-emitting display
Est. expiryOct 1, 2030(~4.2 yrs left)· nominal 20-yr term from priority
H10D 30/6713H10D 86/0221H10D 86/60H10D 30/6737H10D 86/451H10D 86/421H10D 86/40H10D 30/6746H10D 30/6745H10D 30/6731H10D 30/6743H01L 29/78675H01L 29/458H01L 27/3262H01L 27/1248H01L 27/1214H01L 29/78666H10K 59/1213H10K 59/123H10K 2102/3026
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Claims
Abstract
A thin film transistor including: a substrate; an active layer formed over the substrate; a gate insulating layer formed over the active layer; a gate electrode formed over the gate insulating layer; an interlayer insulating layer formed over the gate electrode; and source and drain electrodes that contact the active layer via the interlayer insulating layer. The source and drain electrodes may have a structure including an aluminum (Al) layer, an aluminum-nickel alloy (AlNiX) layer, and an indium tin oxide (ITO) layer, which are sequentially stacked.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A thin film transistor comprising:
a substrate; an active layer formed over the substrate and comprising a silicon layer having a nitrated surface; a gate insulating layer formed over the active layer; a gate electrode formed over the gate insulating layer; an interlayer insulating layer formed over the gate electrode; and source and drain electrodes that contact the active layer through openings in the interlayer insulating layer and comprise an aluminum-nickel alloy (AlNiX) layer and an indium tin oxide (ITO) layer, which are sequentially stacked.
2 . The thin film transistor of claim 1 , wherein the X of the AlNiX layer comprises lanthanum (La).
3 . The thin film transistor of claim 1 , wherein the Al layer has a thickness in the range of 300 Å to 1000 Å and the AlNiX layer has a thickness in the range of 3000 Å to 6000 Å.
4 . The thin film transistor of claim 1 , further comprising a buffer layer between the substrate and the active layer.Join the waitlist — get patent alerts
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