Apparatus and method for reducing average scan rate to detect a conductive object on a sensing device

Abstract

A switch circuit and method is described. In one embodiment, the switch circuit is configured to couple each of a plurality of plurality of capacitive sense elements and a plurality of capacitance sensors in different modes. In a first mode, the switch circuit is configured to couple each of the plurality of capacitance sensors to a group of two or more of the plurality of capacitive sense elements. In a second mode, the switch circuit is configured to couple the plurality of capacitance sensors to individual ones of the two or more of the plurality of capacitive sense elements in one of the groups.

What is claimed is: 
     
         1 - 20 . (canceled) 
     
     
         21 . An apparatus comprising:
 a capacitance measurement circuit; and   a plurality of sensor elements coupled to the capacitance measurement circuit, the plurality of sensor elements corresponding to a first and second area on a surface, wherein the capacitance measurement circuit is configured to measure capacitance of the first area in a first mode and to measure capacitance of the second area in a second mode.   
     
     
         22 . The apparatus of  claim 21 , wherein each of the plurality of sensor elements are coupled to pins of the capacitance measurement circuit. 
     
     
         23 . The apparatus of  claim 21 , wherein the capacitance measurement circuit is disposed on an integrated circuit. 
     
     
         24 . The apparatus of  claim 21 , wherein the plurality of sensor elements is arranged in an array of rows and an array of columns. 
     
     
         25 . The apparatus of  claim 24 , wherein the plurality of sensor elements substantially covers an area defined by a user interface.