US2016043089A1PendingUtilityA1
Memory cell support lattice
Est. expiryAug 21, 2032(~6.1 yrs left)· nominal 20-yr term from priority
H10P 50/283H10P 50/73H10P 14/6329H10D 1/716H10D 1/042H01L 21/31144H01L 27/10852H01L 21/02266H01L 21/31116H10B 12/318H10B 12/033H10B 12/315
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Claims
Abstract
Memory cell support lattices and methods of forming the same are described herein. As an example, a method of forming a memory cell support lattice includes forming a mask on a number of capacitor elements in an array, such that a space between vertically and horizontally adjacent capacitor elements is fully covered and a space between diagonally adjacent capacitor elements is partially covered and forming a support lattice in a support material by etching the support material to remove portions of the support material below the openings in the mask.
Claims
exact text as granted — not AI-modified1 - 20 . (canceled)
21 . A memory array, comprising:
a self-aligned support lattice that surrounds a number of capacitor elements in a memory cell array; wherein the self-aligned support lattice includes a number of openings diagonally between the number of capacitor elements; and wherein the self-aligned support lattice provides support to the number of capacitor elements to limit lateral movement of the number of capacitor elements.
22 . The memory array of claim 21 , wherein the self-aligned support lattice comprises a nitride material.
23 . The memory array of claim 21 , wherein the self-aligned support lattice comprises an oxide material.
24 . The memory array of claim 21 , wherein the array of memory cells includes DRAM memory cells.
25 . The memory array of claim 21 , wherein the self-aligned support lattice comprises openings exposing a portion of the capacitor elements below the self-aligned support lattice.
26 . The memory array of claim 21 , wherein the capacitor elements comprise titanium nitride (TiN).
27 . A memory array, comprising:
a number memory cells, wherein each of the number of memory cells includes an access device and a capacitor element and wherein each capacitor element is surrounded by a support lattice having self-aligned openings diagonally between diagonally adjacent capacitor elements.
28 . The memory array of claim 27 , wherein a number of access lines are coupled to the access devices of the number of memory cells.
29 . The memory array of claim 27 , wherein a number of data lines are coupled to the capacitor elements of the number of memory cells.
30 . The memory array of claim 27 , wherein the support lattice is recessed below an upper surface of each capacitor element.
31 . The memory array of claim 27 , wherein the support lattice comprises openings exposing a portion of the capacitor elements below the self-aligned support lattice.
32 . The memory array of claim 27 , wherein the support lattice provides support to limit lateral movement of each capacitor element.
33 . The memory array of claim 27 , wherein the support lattice provides spacing between adjacent capacitor elements to prevent capacitor elements from contacting each other.
34 . A memory array, comprising:
a number memory cells, wherein each of the number of memory cells includes an access device and a capacitor element; wherein each capacitor element is surrounded by a support lattice having self-aligned openings diagonally between diagonally adjacent capacitor elements; wherein the support lattice is continuous laterally between laterally adjacent capacitor elements; and wherein the support lattice provides spacing between adjacent capacitor elements to prevent capacitor elements from contacting each other.
35 . The memory array of claim 34 , wherein the support lattice is recessed below an upper surface of each capacitor element.
36 . The memory array of claim 34 , wherein the support lattice is located on between an upper surface of each capacitor element and a dielectric material that surrounds each capacitor element.
37 . The memory array of claim 34 , wherein the support lattice comprises a nitride material.
38 . The memory array of claim 34 , wherein the support lattice comprises an oxide material.
39 . The memory array of claim 34 , wherein each capacitor element is surrounded by a dielectric material below the support lattice.
40 . The memory array of claim 39 , wherein the dielectric material is formed below the support lattice through the openings in the support lattice.Join the waitlist — get patent alerts
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