Fine particle analyzing apparatus, fine particle analyzing method, program, and fine particle analyzing system

Abstract

Provided are a fine particle analyzing apparatus, a fine particle analyzing method, a program, and a fine particle analyzing system, which are capable of easily separating a plurality of types of spectral data on fluorescence emitted from a fine particle. A data extracting unit included in the fine particle analyzing apparatus selectively extracts spectral data, which contain predetermined information, from spectral data on fluorescence emitted from a fine particle. The data extracting unit selectively extracts spectral data indicating the maximum intensity in a wavelength area set beforehand from one or a plurality of types of spectral data indicating intensity of fluorescence emitted from the fine particle for each of a plurality of wavelengths.

1 . A fine particle analyzing apparatus including a data extracting unit that selectively extracts spectral data, which contain predetermined information, from spectral data on fluorescence emitted from a fine particle. 
     
     
         2 . The fine particle analyzing apparatus according to  claim 1 , wherein the data extracting unit selectively extracts spectral data indicating the maximum intensity in a wavelength area set beforehand from one or a plurality of types of spectral data indicating intensity of fluorescence emitted from the fine particle for each of a plurality of wavelengths. 
     
     
         3 . The fine particle analyzing apparatus according to  claim 2 , wherein the data extracting unit removes spectral data indicating the maximum intensity lower than a predetermined intensity from the one or the plurality of types of spectral data. 
     
     
         4 . The fine particle analyzing apparatus according to  claim 2 , comprising
 a display adjusting unit that allows display of the one or the plurality of types of spectral data, wherein   when the spectral data has been extracted by the data extracting unit, the display adjusting unit allows selective display of the extracted spectral data.   
     
     
         5 . The fine particle analyzing apparatus according to  claim 4 , comprising
 a data obtaining unit that obtains the one or the plurality of types of spectral data, wherein   the display adjusting unit allows overlapped display of the spectral data obtained by the data obtaining unit.   
     
     
         6 . The fine particle analyzing apparatus according to  claim 5 , wherein the display adjusting unit varies display colors of the spectral data in accordance with frequency of overlap between the spectral data. 
     
     
         7 . The fine particle analyzing apparatus according to  claim 5 , wherein the display adjusting unit changes display of the spectral data to display of histogram data showing frequency distribution of the fine particle. 
     
     
         8 . The fine particle analyzing apparatus according to  claim 6 , wherein the display adjusting unit allows selective display of the spectral data exhibiting overlap frequency within a predetermined range. 
     
     
         9 . The fine particle analyzing apparatus according to  claim 2 , comprising:
 a user information obtaining unit that obtains user input information containing information on the wavelength area, wherein   the data extracting unit selectively extracts the spectral data based on the user input information.   
     
     
         10 . The fine particle analyzing apparatus according to  claim 1 , wherein the data extracting unit includes a polynomial approximation processing unit that approximates the spectral data to a polynomial. 
     
     
         11 . The fine particle analyzing apparatus according to  claim 10 , wherein the polynomial is a linear equation. 
     
     
         12 . The fine particle analyzing apparatus according to  claim 10 , further comprising
 a data obtaining unit that obtains a plurality of the spectral data from an identical object at predetermined time intervals, wherein   the polynomial approximation processing unit approximates each of the plurality of spectral data, which have been obtained by the data obtaining unit at the predetermined time intervals, to a polynomial.   
     
     
         13 . The fine particle analyzing apparatus according to  claim 1 , comprising a detecting unit that detects fluorescence emitted from the fine particle. 
     
     
         14 . The fine particle analyzing apparatus according to  claim 13 , comprising a sorting unit that sorts the fine particle based on the spectral data extracted by the data extracting unit. 
     
     
         15 . A fine particle analyzing method including:
 by use of a data extracting unit, selectively extracting spectral data, which contain predetermined information, from spectral data on fluorescence emitted from a fine particle.   
     
     
         16 . A program which causes a fine particle analyzing apparatus to perform a function of selectively extracting spectral data, which contain predetermined information, from spectral data on fluorescence emitted from a fine particle. 
     
     
         17 . A fine particle analyzing system including:
 a fine particle analyzing apparatus that includes a data extracting unit which selectively extracts spectral data from spectral data on fluorescence emitted from a fine particle, the spectral data containing predetermined information.   
     
     
         18 . The fine particle analyzing system according to  claim 17 , wherein the fine particle analyzing apparatus includes a detecting unit that detects fluorescence emitted from the fine particle. 
     
     
         19 . The fine particle analyzing system according to  claim 18 , comprising a server that includes an information storing unit configured to stores one or a plurality of spectral data indicating intensity of fluorescence detected by the detecting unit of the fine particle analyzing apparatus for each of a plurality of wavelengths.