US2015311146A1PendingUtilityA1
Wiring substrate and method of manufacturing the same, and semiconductor device and method of manufacturing the same
Est. expiryMar 30, 2032(~5.7 yrs left)· nominal 20-yr term from priority
H10W 70/687H10D 64/011H10W 70/093H10W 70/69H10W 70/65H10W 90/701H05K 1/185H01L 23/49894H01L 23/49811H01L 23/49838
44
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Claims
Abstract
A wiring substrate may include: a base having a predetermined thickness; a plurality of electrode portions formed to protrude on one surface in a thickness direction of the base; a wiring provided in the base and electrically connected to the electrode portions; and a resin layer formed on the base to fill between the plurality of electrode portions. An upper surface of the resin layer may be formed in a concave shape lower than a maximum height of the electrode portion, and an upper surface of the electrode portion and the upper surface of the resin layer form a continuous curved surface.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A wiring substrate comprising:
a base having a predetermined thickness; a plurality of electrode portions formed to protrude on one surface in a thickness direction of the base; a wiring provided in the base and electrically connected to the electrode portions; and a resin layer formed on the base to fill between the plurality of electrode portions, wherein an upper surface of the resin layer is formed in a concave shape lower than a maximum height of the electrode portion, and an upper surface of the electrode portion and the upper surface of the resin layer form a continuous curved surface, and wherein the resin layer is at substantially the same height as the maximum height of the electrode portion when heated to a predetermined temperature and expanded.
2 . The wiring substrate according to claim 1 , wherein the base is formed of a semiconductor or an insulator.
3 . The wiring substrate according to claim 1 , wherein the electrode portion is formed of one of gold, copper, nickel and an alloy containing at least one of these metals.
4 . The wiring substrate according to claim 1 , wherein a formation pitch of the electrode portion is 10 micrometers or less.
5 . A semiconductor device comprising:
a wiring substrate including:
a base having a predetermined thickness;
a plurality of electrode portions formed to protrude on one surface in a thickness direction of the base;
a wiring provided in the base and electrically connected to the electrode portions;
a resin layer formed on the base to fill between the plurality of electrode portions; and
a semiconductor element provided in the base,
wherein an upper surface of the resin layer is formed in a concave shape lower than a maximum height of the electrode portion, and an upper surface of the electrode portion and the upper surface of the resin layer form a continuous curved surface, and wherein the resin layer is at substantially the same height as the maximum height when heated to a predetermined temperature and expanded.
6 . A semiconductor device comprising:
a wiring substrate including:
a base having a predetermined thickness;
a plurality of electrode portions formed to protrude on one surface in a thickness direction of the base;
a wiring provided in the base and electrically connected to the electrode portions;
a resin layer formed on the base to fill between the plurality of electrode portions; and
a semiconductor chip or a semiconductor package provided in the base,
wherein an upper surface of the resin layer is formed in a concave shape lower than a maximum height of the electrode portion, and an upper surface of the electrode portion and the upper surface of the resin layer form a continuous curved surface, and wherein the resin layer is at substantially the same height as the maximum height when heated to a predetermined temperature and expanded.Join the waitlist — get patent alerts
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