US2015303251A1PendingUtilityA1

Bonded epitaxial oxide structures for compound semiconductor on silicon substrates

Assignee: IBMPriority: Aug 12, 2013Filed: Jun 6, 2015Published: Oct 22, 2015
Est. expiryAug 12, 2033(~7 yrs left)· nominal 20-yr term from priority
H10P 14/3434H10P 14/3421H10P 14/3254H10P 14/3221H10P 14/2926H10P 14/2905H10W 10/181H10P 90/1916H10P 90/1914H10P 90/00H10P 90/1904H10D 62/8503H10D 62/824H10D 62/86H10D 62/82H10D 62/115H01L 29/22H01L 29/267H01L 29/205H01L 29/0649
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Claims

Abstract

A structure includes a handle substrate and an epitaxial oxide layer. The epitaxial oxide layer is bonded directly or indirectly to the handle substrate. Also included is a compound semiconductor layer adjoining and lattice matched to the epitaxial oxide layer.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A structure comprising:
 a handle substrate;   an epitaxial oxide layer, the epitaxial oxide layer being bonded directly or indirectly to the handle substrate, and   a compound semiconductor layer adjoining and lattice matched to the epitaxial oxide layer.   
     
     
         2 . The structure of  claim 1 , wherein the compound semiconductor layer is a group III-V compound layer or a group II-VI compound layer. 
     
     
         3 . The structure of  claim 2 , wherein the handle substrate is a bulk silicon substrate having a silicon oxide layer, the silicon oxide layer adjoining the epitaxial oxide layer. 
     
     
         4 . A structure comprising:
 a germanium base;   one or more compound semiconductor layers adjoining the germanium base, the one or more compound semiconductor layers including a top layer of a desired compound semiconductor material, and   an epitaxial oxide layer adjoining and lattice matched to the top layer.   
     
     
         5 . The structure of  claim 4 , further including an implanted cleavage plane layer within the top layer. 
     
     
         6 . The structure of  claim 5 , further including a silicon substrate, the germanium base comprising a germanium layer on the silicon substrate. 
     
     
         7 . The structure of  claim 6 , wherein the top layer is a zinc selenide layer adjoining the germanium layer, the epitaxial oxide layer adjoining the zinc selenide layer. 
     
     
         8 . The structure of  claim 5 , further including a handle wafer bonded to the epitaxial oxide layer. 
     
     
         9 . The structure of  claim 5 , wherein the one or more compound semiconductor layers comprises a lattice engineered stack of compound semiconductor materials, the lattice engineered stack including a graded layer adjoining the top layer. 
     
     
         10 . The structure of  claim 9 , wherein the one or more compound semiconductor layers are comprised of one or more group III-V materials.

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