US2015253387A1PendingUtilityA1

Programmable interface-based validation and debug

Assignee: TEXAS INSTRUMENTS INCPriority: Sep 26, 2013Filed: May 26, 2015Published: Sep 10, 2015
Est. expirySep 26, 2033(~7.2 yrs left)· nominal 20-yr term from priority
G06F 30/331G06F 30/34G06F 11/27G01R 31/3177G06F 11/273G06F 9/44G01R 13/28
36
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Claims

Abstract

A programmable interface-based validation and debug system includes, for example, a test connector that is arranged to communicatively couple a design under test to the test fixture. A programmable logic interface is communicatively coupled to the test connector and is arranged to receive a downloadable test bench, where the downloadable test bench is arranged to apply test vectors from a first set of test vectors to a first test control bus. A multiplexer is arranged to selectively couple one of the first test control bus and a second test control bus to a shared test bus that is coupled to the test connector, where the second test control bus is arranged to apply test vectors from a second set of test vectors provided by, for example, a debugger that is operated by a human.

Claims

exact text as granted — not AI-modified
1 - 20 . (canceled) 
     
     
         21 . A method for validating a debugging a design under test comprising the steps of:
 communicating to the design under test via a test connector including a shared test bus coupled to a first set of selected pins of the design under test;   receiving a downloadable test bench including a first set of test vectors from a first test control bus;   receiving a second set of test vectors from a second test control bus; and   selectively coupling one of the first set of test vectors and the second set of test vectors to the shared test bus.   
     
     
         22 . The method of  claim 21 , wherein:
 supplying the second set of test vectors from a debugger operable by a human to control execution of the first set of test vectors.   
     
     
         23 . The method of  claim 22 , further comprising the step of:
 transferring mastership of the shared test bus between the debugger and the downloadable test bench.   
     
     
         24 . The method of  claim 23 , further comprising the step of:
 transferring mastership of the shared test bus dependent upon a received command.   
     
     
         25 . The method of  claim 23 , further comprising the step of:
 transferring mastership of the shared test bus dependent upon contents of the first test control bus.   
     
     
         26 . The method of  claim 23 , further comprising the step of:
 transferring mastership of the shared test bus dependent upon contents of the second test control bus.   
     
     
         27 . The method of  claim 23 , further comprising the step of:
 transferring mastership of the shared test bus dependent upon an output of the design under test.   
     
     
         28 . The method of  claim 22 , further comprising the step of:
 validating performance of the design under test via the first set of test vectors coupled to the test connector.   
     
     
         29 . The method of  claim 21 , further comprising the step of:
 storing the first set of test vectors in an addressable memory.   
     
     
         30 . The method of  claim 29 , further comprising the step of:
 generating an address by which test vectors from the first set of test vectors are retrieved from the addressable memory via a program counter.   
     
     
         31 . The method of  claim 30 , further comprising the step of:
 changing the value of the program counter in response to a value of retrieved test vectors from the first set of test vectors.   
     
     
         32 . The method of  claim 31 , further comprising the steps of:
 retrieving a first portion of the first set of retrieved test vectors of the first set of test vectors;   applying the first set of selected pins of the test connector;   retrieving a second portion of the first set of retrieved test vectors of the first set of test vectors;   applying the second portion of the first set of retrieved test vectors a third test bus to a second set of selected pins of the test connector, wherein the second set of selected pins of the test connector includes selected pins that are different from the selected pins in the first set of selected pins.

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