Method and equipment for testing semiconductor apparatuses simultaneously and continuously

Abstract

A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, Which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.

What is claimed is: 
     
         1 . A method of testing a plurality of semiconductor apparatuses, the method comprising:
 mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits;   loading test software into the test circuits;   performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software; and   removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board,   wherein upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.