Photoelectric conversion element, photoelectric conversion system, and method for production of photoelectric conversion element
Abstract
A photoelectric conversion element of an embodiment is a photoelectric conversion element which performs photoelectric conversion by receiving illumination light having n light emission peaks having a peak energy Ap (eV) (where 1≦p≦n and 2≦n) of 1.59≦Ap≦3.26 and a full width at half maximum Fp (eV) (where 1≦p≦n and 2≦n), wherein the photoelectric conversion element includes m photoelectric conversion layers having a band gap energy Bq (eV) (where 1≦q≦m and 2≦m≦n), and the m photoelectric conversion layers each satisfy the relationship of Ap−Fp<Bq≦Ap with respect to any one of the n light emission peaks.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A photoelectric conversion system comprising:
an illuminator having n (n is a natural number) light emission peaks each having a peak energy Ap (eV) (where 1≦p≦n and 2≦n) of 1.59≦Ap≦3.26 and a full width at half maximum Fp (eV) (where 1≦p≦n and 2≦n); and an electronic device having a photoelectric conversion element, the element includes m photoelectric conversion layers having a band gap energy Bq (eV) (where 1≦q≦m and 2≦m≦n), and the m (m is a natural number) photoelectric conversion layers each satisfy the relationship of Ap=Fp<Bq≦Ap with respect to any one of the n light emission peaks.
2 . The system according to claim 1 , wherein m=n.
3 . The system according to claim 1 , wherein the m photoelectric conversion layers each satisfy the relationship of Ap−0.9 Fp<Bq<Ap−0.7 Fp with respect to any one of the n light emission peaks.
4 . The system according to claim 1 , wherein the m photoelectric conversion layers have a composition denoted as In x Ga y Al z N (0<x≦1, 0≦y<1, 0≦z<1 and x+y+z≦1).
5 . The system according to claim 1 , wherein the electronic device is a portable information terminal.
6 . A method for manufacturing a photoelectric conversion element comprising:
forming a GaN-based n-type semiconductor layer on a substrate; forming on the n-type semiconductor layer a first photoelectric conversion layer having a composition denoted as In x1 Ga y1 Al z1 N (0<x1≦1, 0≦y1<1, 0≦z1<1 and x1+y1+z1≦1); forming on the first photoelectric conversion layer a second photoelectric conversion layer having a composition denoted as In x2 Ga y2 Al z2 N (0<x2≦1, 0≦y2<1, 0≦z2<1 and x2+y2+z2≦1) wherein x1<x2; forming a GaN-based p-type semiconductor layer on the second photoelectric conversion layer; forming a p-side electrode on the p-type semiconductor layer; removing the substrate to expose the n-type semiconductor layer; and forming an n-side electrode on the n-type semiconductor layer on a side opposite to the first photoelectric conversion layer.
7 . The method according to claim 6 , wherein a heat dissipation layer of copper (Cu) is formed on the p-side electrode.
8 . The method according to claim 6 , wherein a reflection layer of silver (Ag) is formed between the p-type semiconductor layer and the p-side electrode.
9 . The method according to claim 6 , wherein the n-type semiconductor layer, the first photoelectric conversion layer, the second photoelectric conversion layer and the p-type semiconductor layer are formed by a MOCVD method.
10 . A method for manufacturing a photoelectric conversion element comprising:
forming a GaN-based first p-type semiconductor layer on a substrate; forming on the first p-type semiconductor layer a first photoelectric conversion layer having a composition denoted as In x1 Ga y1 Al z1 N (0<x1≦1, 0≦y1<1, 0≦z1<1 and x1+y1+z1≦1); forming on the first photoelectric conversion layer a second photoelectric conversion layer having a composition denoted as In x2 Ga y2 Al z2 N (0<x2≦1, 0≦y2<1, 0≦z2<1 and x2+y2+z2≦1) wherein x1<x2; forming a GaN-based n-type semiconductor layer on the second photoelectric conversion layer; forming an n-side electrode on the n-type semiconductor layer; removing the substrate to expose the first p-type semiconductor layer; forming a second p-type semiconductor layer on the first p-type semiconductor layer on a side opposite to the first photoelectric conversion layer; and forming a p-side electrode on the second p-type semiconductor layer on a side opposite to the first photoelectric conversion layer.
11 . A method for manufacturing a photoelectric conversion element comprising:
forming a GaN-based p-type semiconductor layer on a substrate; forming on the p-type semiconductor layer a first photoelectric conversion layer having a composition denoted as In x1 Ga y1 Al z1 N (0<x1≦1, 0≦y1<1, 0≦z1<1 and x1+y1+z1≦1); forming on the first photoelectric conversion layer a second photoelectric conversion layer having a composition denoted as In x2 Ga y2 Al z2 N (0<x2≦1, 0≦y2<1, 0≦z2<1 and x2+y2+z2≦1) wherein x1<x2; forming a GaN-based n-type semiconductor layer on the second photoelectric conversion layer; forming an n-side electrode on the n-type semiconductor layer; removing the substrate to expose the p-type semiconductor layer; and forming a p-side electrode of ITO or ZnO on the p-type semiconductor layer on a side opposite to the first photoelectric conversion layer.
12 . The method according to claim 11 , wherein the ITO or ZnO is deposited by a sputtering method.Join the waitlist — get patent alerts
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