Photosensitive polysiloxane composition and uses thereof
Abstract
The invention relates to a photosensitive polysiloxane composition and a thin film formed by the aforementioned photosensitive polysiloxane composition. The thin film is a planarization film of a TFT substrate, an interlayer insulating film or an overcoat of a core material or a protective material in a waveguide. The invention is to provide a photosensitive polysiloxane composition having excellent surface flatness and high tapered angle of a pattern. The photosensitive polysiloxane composition comprises a polysiloxane (A), an o-naphthoquinone diazide sulfonic acid ester (B), an alkali-soluble resin containing a silyl group (C) and a solvent (D).
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A photosensitive polysiloxane composition comprising:
a polysiloxane (A); an o-naphthoquinone diazide sulfonic acid ester (B); an alkali-soluble resin containing a silyl group (C); and a solvent (D).
2 . The photosensitive polysiloxane composition according to claim 1 , wherein the alkali-soluble resin containing the silyl group (C) is copolymerized by an unsaturated carboxylic acid or unsaturated carboxylic anhydride (c-1), an unsaturated compound containing a silyl group (c-2) represented by Formula (1) and/or an other unsaturated compounds (c-3),
wherein:
R 1 represents a hydrogen atom or a methyl group;
a represents an integer selected from 1 to 6;
R 2 and R 3 independently represent an alkyl group containing 1 to 12 carbon atoms, a phenyl group, an alkoxy group containing 1 to 6 carbon atoms, or a group represented by Formula (2);
b represents an integer selected from 1 to 150; when R 2 and R 3 are plural, each R 2 and R 3 are the same or different;
R 4 represents an alkyl group containing 1 to 6 carbon atoms or a group represented by Formula (3);
wherein:
R 5 , R 6 and R 7 independently represent an alkyl group containing 1 to 12 carbon atoms or a phenyl group;
c represents an integer selected from 2 to 13; when R 6 and R 7 are plural, each R 6 and R 7 are the same or different; and
wherein:
R 8 , R 9 and R 10 independently represent an alkyl group containing 1 to 12 carbon atoms or a phenyl group to.
3 . The photosensitive polysiloxane composition according to claim 1 , wherein the polysiloxane (A) is copolymerized by a compound represented by Formula (4),
Si(R a ) W (OR b ) 4-W Formula (4),
wherein: R a represents hydrogen, an alkyl group containing 1 to 10 carbon atoms, an alkenyl group containing 2 to 10 carbon atoms, an aryl group containing 6 to 15 carbon atoms, an alkyl group containing an acid anhydride group, an alkyl group containing an epoxy group, or an alkoxy group containing an epoxy group; when R a is plural, each R a is the same or different; R b represents hydrogen, an alkyl group containing 1 to 6 carbon atoms, an acyl group containing 1 to 6 carbon atoms, an aryl group containing 6 to 15 carbon atoms; when R b is plural, each R b is the same or different; and w represents an integer from 0 to 3.
4 . The photosensitive polysiloxane composition according to claim 3 , wherein at least one of R a represents the alkyl group containing the acid anhydride group, the alkyl group containing the epoxy group, or the alkoxy group containing the epoxy group.
5 . The photosensitive polysiloxane composition according to claim 1 , wherein based on 100 parts by weight of the used amount of the polysiloxane (A), the used amount of the o-naphthoquinone diazide sulfonic acid ester (B) is from 2 parts by weight to 30 parts by weight; the used amount of the alkali-soluble resin containing the silyl group (C) is from 0.5 part by weight to 20 parts by weight; and the used amount of the solvent (D) is from 100 parts by weight to 1200 parts by weight.
6 . A method for forming a thin film on a substrate comprising applying the photosensitive polysiloxane composition according to claim 1 on the substrate.
7 . The method according to claim 6 , wherein the alkali-soluble resin containing the silyl group (C) is copolymerized by an unsaturated carboxylic acid or unsaturated carboxylic anhydride (c-1), an unsaturated compound containing a silyl group (c-2) represented by Formula (1) and/or an other unsaturated compounds (c-3),
wherein:
R 1 represents a hydrogen atom or a methyl group;
a represents an integer selected from 1 to 6;
R 2 and R 3 independently represent an alkyl group containing 1 to 12 carbon atoms, a phenyl group, an alkoxy group containing 1 to 6 carbon atoms, or a group represented by Formula (2);
b represents an integer selected from 1 to 150; when R 2 and R 3 are plural, each R 2 and R 3 are the same or different;
R 4 represents an alkyl group containing 1 to 6 carbon atoms or a group represented by Formula (3);
wherein:
R 5 , R 6 and R 7 independently represent an alkyl group containing 1 to 12 carbon atoms or a phenyl group;
c represents an integer selected from 2 to 13; when R 6 and R 7 are plural, each R 6 and R 7 are the same or different; and
wherein:
R 8 , R 9 and R 10 independently represent an alkyl group containing 1 to 12 carbon atoms or a phenyl group.
8 . The method according to claim 6 , wherein the polysiloxane (A) is copolymerized by a compound represented by Formula (4),
Si(R a ) W (OR b ) 4-W Formula (4),
wherein: R a represents hydrogen, an alkyl group containing 1 to 10 carbon atoms, an alkenyl group containing 2 to 10 carbon atoms, an aryl group containing 6 to 15 carbon atoms, an alkyl group containing an acid anhydride group, an alkyl group containing an epoxy group, or an alkoxy group containing an epoxy group; when R a is plural, each R a is the same or different; R b represents hydrogen, an alkyl group containing 1 to 6 carbon atoms, an acyl group containing 1 to 6 carbon atoms, an aryl group containing 6 to 15 carbon atoms; when R b is plural, each R b is the same or different; and w represents an integer from 0 to 3.
9 . The method according to claim 8 , wherein at least one of R a represents the alkyl group containing the acid anhydride group, the alkyl group containing the epoxy group, or the alkoxy group containing the epoxy group.
10 . The method according to claim 6 , wherein based on 100 parts by weight of the used amount of the polysiloxane (A), the used amount of the o-naphthoquinone diazide sulfonic acid ester (B) is from 2 parts by weight to 30 parts by weight; the used amount of the alkali-soluble resin containing the silyl group (C) is from 0.5 part by weight to 20 parts by weight; and the used amount of the solvent (D) is from 100 parts by weight to 1200 parts by weight.
11 . A thin film on a substrate, which is manufactured by the method according to claim 6 .
12 . The thin film according to claim 11 , wherein the alkali-soluble resin containing the silyl group (C) is copolymerized by an unsaturated carboxylic acid or unsaturated carboxylic anhydride (c-1), an unsaturated compound containing a silyl group (c-2) represented by Formula (1) and/or an other unsaturated compounds (c-3),
wherein:
R 1 represents a hydrogen atom or a methyl group;
a represents an integer selected from 1 to 6;
R 2 and R 3 independently represent an alkyl group containing 1 to 12 carbon atoms, a phenyl group, an alkoxy group containing 1 to 6 carbon atoms, or a group represented by Formula (2);
b represents an integer selected from 1 to 150; when R 2 and R 3 are plural, each R 2 and R 3 are the same or different;
R 4 represents an alkyl group containing 1 to 6 carbon atoms or a group represented by Formula (3);
wherein:
R 5 , R 6 and R 7 independently represent an alkyl group containing 1 to 12 carbon atoms or a phenyl group;
c represents an integer selected from 2 to 13; when R 6 and R 7 are plural, each R 6 and R 7 are the same or different; and
wherein:
R 8 , R 9 and R 10 independently represent an alkyl group containing 1 to 12 carbon atoms or a phenyl group.
13 . The thin film according to claim 11 , wherein the polysiloxane (A) is copolymerized by a compound represented by Formula (4),
Si(R a ) W (OR b ) 4-W Formula (4),
wherein: R a represents hydrogen, an alkyl group containing 1 to 10 carbon atoms, an alkenyl group containing 2 to 10 carbon atoms, an aryl group containing 6 to 15 carbon atoms, an alkyl group containing an acid anhydride group, an alkyl group containing an epoxy group, or an alkoxy group containing an epoxy group; when R a is plural, each R a is the same or different; R b represents hydrogen, an alkyl group containing 1 to 6 carbon atoms, an acyl group containing 1 to 6 carbon atoms, an aryl group containing 6 to 15 carbon atoms; when R b is plural, each R b is the same or different; and w represents an integer from 0 to 3.
14 . The thin film according to claim 13 , wherein at least one of R a represents the alkyl group containing the acid anhydride group, the alkyl group containing the epoxy group, or the alkoxy group containing the epoxy group.
15 . The thin film according to claim 11 , wherein based on 100 parts by weight of the used amount of the polysiloxane (A), the used amount of the o-naphthoquinone diazide sulfonic acid ester (B) is from 2 parts by weight to 30 parts by weight; the used amount of the alkali-soluble resin containing the silyl group (C) is from 0.5 part by weight to 20 parts by weight; and the used amount of the solvent (D) is from 100 parts by weight to 1200 parts by weight.
16 . The thin film according to claim 11 , wherein the thin film is a planarization film of a TFT substrate in a liquid crystal display element or organic light-emitting display device, an interlayer insulating film or an overcoat of a core material or a protective material in a waveguide.
17 . A device comprising the thin film according to claim 11 .
18 . A device comprising the thin film according to claim 16 .Join the waitlist — get patent alerts
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