Apparatus for evaluating dynamic forces

Abstract

In an apparatus for determining the level of dynamic force required to cause damage to an electronic device, the electronic device may be placed beneath a ram assembly of a dynamic impact testing device. The dynamic impact testing device has a selection of a plurality of different types of tip members, which may be retained by an attachment portion of the ram assembly. The ram assembly is reciprocally movable relative to a base portion with a target area. The ram assembly being positioned relative to said base portion so that said tip portion can impact said target area when the tip member is mounted to said attachment portion.

What is claimed is: 
     
         1 - 20 . (canceled) 
     
     
         21 . A dynamic impact testing device comprising:
 a selection of a plurality of different types of tip members;   a base portion having a target area defined thereon;   a ram assembly reciprocally movable relative to said base portion;   said ram assembly comprising an attachment portion that is capable of retaining at least one of said different types of tip members; and   said ram assembly being positioned relative to said base portion so that said tip portion can impact said target area when said tip member is mounted to said attachment portion.   
     
     
         22 . The dynamic impact testing device of  claim 21 , wherein said attachment portion comprises threads. 
     
     
         23 . The dynamic impact testing device of  claim 21 , wherein said at least one tip member is a vacuum tip. 
     
     
         24 . The dynamic impact testing device of  claim 21 , further comprising:
 a vacuum port formed in said base portion within said target area.   
     
     
         25 . The dynamic impact testing device of  claim 21 , further comprising:
 a plurality of weights, each of said plurality of weights being temporarily mountable on said ram assembly.