US2014343887A1PendingUtilityA1

Temperature measurement device and temperature measuring method

Assignee: SEIKO EPSON CORPPriority: Oct 29, 2010Filed: Aug 5, 2014Published: Nov 20, 2014
Est. expiryOct 29, 2030(~4.3 yrs left)· nominal 20-yr term from priority
Inventors:Sakiko Shimizu
G01K 13/002G01K 7/427G01K 1/165G01K 7/42G01K 13/20
53
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Claims

Abstract

A temperature measurement device includes a temperature measurement part, a heat insulator, and a calculation part. The temperature measurement part is disposed among the heat insulator and has a substrate as a heating medium having a first surface as a contact surface configured to contact a measured body, a first temperature sensor configured to measure, as a first temperature, the temperature at a first measurement point of the substrate, and a second temperature sensor for measuring, as a second temperature, the temperature at a second measurement point different from the first measurement point of the substrate. The first measurement point and the second measurement point are positioned on an external surface of the substrate or inside of the substrate. The calculation part calculates a deep temperature in a deep part of the measured body distant from the first surface on the basis of the first temperature and the second temperature.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A temperature measurement device comprising:
 a temperature measurement part;   a heat insulator; and   a calculation part,   the temperature measurement part being disposed among the heat insulator,   the temperature measurement part having
 a substrate as a heating medium having a first surface as a contact surface for contacting a measured body, 
 a first temperature sensor configured to measure, as a first temperature, the temperature at a first measurement point of the substrate, and 
 a second temperature sensor configured to measure, as a second temperature, the temperature at a second measurement point different from the first measurement point of the substrate, 
   the first measurement point and the second measurement point being positioned on an external surface of the substrate or inside of the substrate,   the calculation part calculating a deep temperature in a deep part of the measured body distant from the first surface on the basis of the first temperature and the second temperature.   
     
     
         2 . The temperature measurement device according to  claim 1 , further comprising a control part, wherein
 the control part divides a time period for measuring the first temperature and the second temperature into a plurality of time periods, and causes the first temperature sensor and the second temperature sensor to execute a plurality of temperature measurements at a predetermined interval for each time period, and   the calculation unit determines the first temperature and the second temperature for each time period by averaging in which a plurality of temperature measurement data obtained by the plurality of measurements is used, and uses the first temperature and the second temperature determined for each the time period to execute calculation, and calculates the deep temperature in a deep part of the measured body.   
     
     
         3 . A temperature measurement method comprising:
 performing a measurement of temperature at a first measurement point and a second measurement point in different positions on an external surface of a substrate or inside the substrate, which is deposited among a heat insulator; and   calculating a deep temperature in a deep part of the measured body distant from the first surface, on the basis of the temperature of the first measurement point and the temperature of the second measurement point.   
     
     
         4 . The temperature measurement method according to  claim 3 , wherein
 the temperature of the first measurement point and the temperature of the second measurement point are measured a plurality of times.

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