Arrangement for actuating an element in a microlithographic projection exposure apparatus
Abstract
The invention relates to arrangements for actuating an element in a microlithographic projection exposure apparatus. In accordance with one aspect, an arrangement for actuating an element in a microlithographic projection exposure apparatus comprises a first number (n R ) of degrees of freedom, wherein an adjustable force can be transmitted to the optical element in each of the-degrees of freedom, and a second number (n A ) of actuators, which are coupled to the optical element in each case via a mechanical coupling for the purpose of transmitting force to the optical element, wherein the second number (n A ) is greater than the first number (n R ). In accordance with one aspect, at least one of the actuators is arranged in a node of at least one natural vibration mode of the optical element.
Claims
exact text as granted — not AI-modified1 .- 20 . (canceled)
21 . An arrangement, comprising:
an optical element configured so that an adjustable force is transmittable to the optical element in a first number of degrees of freedom; and a second number of sensor elements configured to determine a parameter, wherein:
the parameter comprises at least one member selected from the group consisting of a location of the optical element along the first number of degrees of freedom and a position of the optical element along the first number of degrees of freedom; and
the second number is greater than the first number.
22 . The arrangement of claim 21 , wherein the optical element comprises a mirror.
23 . The arrangement of claim 21 , wherein the optical element comprises an actively deformable mirror.
24 . The arrangement of claim 23 , wherein the actively deformable mirror is configured to compensate an undesirable disturbance in the projection exposure apparatus.
25 . The arrangement of claim 21 , wherein the optical element comprises a non-actively deformable mirror.
26 . The arrangement of claim 21 , further comprising a plurality of actuators, wherein each actuator is coupled to the optical element via a mechanical coupling to transmit a force to the optical element.
27 . The arrangement of claim 26 , wherein at least one of the actuators is arranged at a node of at least one natural vibration mode of the optical element.
28 . The arrangement of claim 26 , wherein the actuators are configured so that actuation in the degrees of freedom is substantially orthogonal to at least one natural vibration mode of the optical element.
29 . The arrangement of claim 26 , wherein at least one of the actuators comprises a Lorentz actuator.
30 . The arrangement of claim 21 , further comprising a third number of actuators, wherein each actuator is coupled to the optical element via a mechanical coupling to transmit a force to the optical element, and third number is greater than the first number.
31 . The arrangement of claim 21 , wherein the first number is at least three.
32 . The arrangement of claim 21 , wherein the first number is six.
33 . The arrangement of claim 21 , wherein the arrangement is configured to be used in a microlithographic projection exposure apparatus.
34 . The arrangement of claim 21 , wherein the arrangement is configured to be used in an EUV microlithographic projection exposure apparatus.
35 . An apparatus, comprising:
an arrangement, comprising:
an optical element configured so that an adjustable force is transmittable to the optical element in a first number of degrees of freedom; and
a second number of sensor elements configured to determine a parameter,
wherein:
the parameter comprises at least one member selected from the group consisting of a location of the optical element along the first number of degrees of freedom and a position of the optical element along the first number of degrees of freedom;
the second number is greater than the first number; and
the apparatus is a microlithographic projection exposure apparatus.
36 . The apparatus of claim 35 , wherein the microlithographic projection exposure apparatus is an EUV microlithographic projection exposure apparatus.
37 . A method, comprising:
transmitting a controllable force to an optical element in a first number of degrees of freedom, the optical element being a component of a microlithographic projection exposure apparatus; and using a second number of sensor elements to determine: a) a location of the optical element along the first number of degrees of freedom; and/or b) a position of the optical element along the first number of degrees of freedom, wherein the second number is greater than the first number.
38 . The method of claim 37 , wherein the optical element comprises a mirror.
39 . The method of claim 37 , wherein the optical element comprises a mirror, and the method further comprises using adjustable forces to actively deform the mirror.
40 . The method of claim 37 , wherein the optical element comprises a mirror, and the method further comprises using adjustable forces to position the mirror.
41 . The method of claim 37 , further comprising:
determining an imaging aberration in the projection exposure apparatus; and positioning the optical element to at least partly compensate for the imaging aberration and/or actively deforming the optical element to at least partly compensate for the imaging aberration.
42 . The method of claim 37 , further comprising using actuators to transmit the controllable force to the optical element.
43 . The method of claim 22 , wherein at least one of the actuators is arranged at a node of at least one natural vibration mode of the optical element.
44 . The method of claim 23 , wherein the actuators are configured so that actuation in the degrees of freedom is substantially orthogonal to at least one natural vibration mode of the optical element.
45 . The method of claim 37 , further comprising using a third number actuators to transmit the controllable force to the optical element, wherein the third number is greater than the first number.Join the waitlist — get patent alerts
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