US2014222744A1PendingUtilityA1

Applying Data Regression and Pattern Mining to Predict Future Demand

Assignee: VERSATA DEV GROUP INCPriority: Aug 2, 2005Filed: Apr 14, 2014Published: Aug 7, 2014
Est. expiryAug 2, 2025(expired)· nominal 20-yr term from priority
Inventors:Andrew Maag
G06N 5/02G06F 16/20
46
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Claims

Abstract

A data processing system processes transaction database information to predict future demand using data regression techniques to extract trend line information from historical pattern frequency values. By extrapolating the trend line, a predicted pattern frequency value may be calculated. By applying regression techniques (such as least-squares approximation), the trend line information may be extracted and projected to predict the future pattern frequency which may be applied to calculate the expected value of a recommendation rule.

Claims

exact text as granted — not AI-modified
1 - 20 . (canceled) 
     
     
         21 . A computer-based method of mining one or more patterns from a transaction database, comprising:
 for each of a plurality of predetermined time intervals, measuring a pattern frequency value for a first pattern in a transaction database based on how many times the first pattern occurs in said predetermined time interval; and   processing the pattern frequency values for the first pattern to calculate a predicted pattern frequency value for the first pattern.   
     
     
         22 . The method of  claim 21 , where processing the pattern frequency values comprises applying a linear least-squares approximation to the pattern frequency values and extrapolating to the predicted pattern frequency value for the first pattern. 
     
     
         23 . The method of  claim 21 , where processing the pattern frequency values comprises computing a trend line based on the pattern frequency values and extrapolating the trend line to calculate the predicted pattern frequency value for the first pattern. 
     
     
         24 . The method of  claim 21 , where processing the pattern frequency values comprises using a regression analysis to calculate the predicted pattern frequency value for the first pattern. 
     
     
         25 . The method of  claim 21 , further comprising capping the predicted pattern frequency value to an upper limit to prevent the predicted pattern frequency value from exceeding the upper limit. 
     
     
         26 . The method of  claim 21 , further comprising capping the predicted pattern frequency value to an lower limit to prevent the predicted pattern frequency value from going below the lower limit. 
     
     
         27 . The method of  claim 21 , further comprising using the predicted pattern frequency value to calculate an expected value of a recommendation rule that is based the first pattern. 
     
     
         28 . The method of  claim 21 , where the plurality of predetermined time intervals comprises a plurality of recent time intervals. 
     
     
         29 . The method of  claim 21 , where the plurality of predetermined time intervals comprises a plurality of constant time intervals. 
     
     
         30 . An article of manufacture having at least one recordable medium having stored thereon executable instructions and data which, when executed by at least one processing device, cause the at least one processing device to:
 measure, for each of a plurality of predetermined time intervals, a pattern frequency value for a first pattern in a transaction database based on how many times the first pattern occurs in the predetermined time interval; and   process the pattern frequency values for the first pattern to calculate a predicted pattern frequency value for the first pattern.   
     
     
         31 . The article of manufacture of  claim 30 , wherein the processing device processes the pattern frequency values by applying a linear least-squares approximation to the pattern frequency values and extrapolating to the predicted pattern frequency value for the first pattern. 
     
     
         32 . The article of manufacture of  claim 30 , wherein the processing device processes the pattern frequency values by computing a trend line based on the pattern frequency values and extrapolating the trend line to calculate the predicted pattern frequency value for the first pattern. 
     
     
         33 . The article of manufacture of  claim 30 , wherein the processing device processes the pattern frequency values by using a regression analysis to calculate the predicted pattern frequency value for the first pattern. 
     
     
         34 . The article of manufacture of  claim 30 , wherein the executable instructions and data, when executed by at least one processing device, cause the at least one processing device to cap the predicted pattern frequency value to an upper limit to prevent the predicted pattern frequency value from exceeding the upper limit. 
     
     
         35 . The article of manufacture of  claim 30 , wherein the executable instructions and data, when executed by at least one processing device, cause the at least one processing device to cap the predicted pattern frequency value to an lower limit to prevent the predicted pattern frequency value from going below the lower limit. 
     
     
         36 . The article of manufacture of  claim 30 , wherein the executable instructions and data, when executed by at least one processing device, cause the at least one processing device to use the predicted pattern frequency value to calculate an expected value of a recommendation rule that is based the first pattern.

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