Chemical mechanical polishing apparatus and methods
Abstract
In one aspect, a substrate polishing apparatus is disclosed. The apparatus has a polishing platform having two or more zones, each zone adapted to contain a different slurry component. In another aspect, a substrate polishing system is provided having a holder to hold a substrate, a polishing platform having a polishing pad, and a distribution system adapted to dispense, in a timed sequence, at least two different slurry components selected from a group consisting of an oxidation slurry component, a material removal slurry component, and a corrosion inhibiting slurry component. Polishing methods and systems adapted to polish substrates are provided, as are numerous other aspects.
Claims
exact text as granted — not AI-modifiedThe invention claimed is:
1 . A substrate polishing apparatus, comprising:
a polishing platform having two or more zones, each zone adapted to contain a different slurry component.
2 . The substrate polishing apparatus of claim 1 , comprising a linear polishing platform wherein the two or more zones are arranged across a width.
3 . The substrate polishing apparatus of claim 1 , comprising a rotary polishing platform wherein the two or more zones are arranged as concentric annuli.
4 . The substrate polishing apparatus of claim 1 , comprising a distributor adapted to dispense at least two of the different slurry components to the two or more zones.
5 . The substrate polishing apparatus of claim 4 , wherein the distributor includes a first set of outlets adapted to disburse a first slurry component to one of the two or more zones, and a second set of outlets adapted to disburse a second slurry component to another of the two or more zones.
6 . The substrate polishing apparatus of claim 1 , wherein each zone has a width of about 2 mm or more.
7 . The substrate polishing apparatus of claim 1 , wherein a first zone has only an oxidation slurry component dispensed therein.
8 . The substrate polishing apparatus of claim 1 , wherein a second zone has only a material removal slurry component dispensed therein.
9 . The substrate polishing apparatus of claim 1 , wherein a third zone has only a corrosion inhibition slurry component dispensed therein.
10 . The substrate polishing apparatus of claim 1 , wherein a first zone and a second zone include slurry components having different chemical compositions.
11 . The substrate polishing apparatus of claim 1 , comprising a distribution system adapted to dispense into the two or more zones at least two different slurry components selected from a group consisting of:
a surface modification slurry component, and a material removal slurry component.
12 . The substrate polishing apparatus of claim 1 , wherein a rinsing liquid zone is dispensed between the two or more zones.
13 . A substrate polishing system, comprising:
a substrate holder adapted to hold a substrate; and a polishing platform having a moveable polishing pad with two or more zones, each zone operable to receive a different slurry component.
14 . A method of polishing a substrate, comprising:
providing a substrate in a substrate holder; providing a polishing platform having a moveable polishing pad; and dispensing a different slurry component into two or more zones on the polishing pad.
15 . A substrate polishing system, comprising:
a substrate holder adapted to hold a substrate; a polishing platform having a polishing pad moveable relative to the substrate; and a distribution system adapted to dispense, in a timed sequence, at least two different slurry components selected from a group consisting of
a surface modification slurry component, and
a material removal slurry component.
16 . The system of claim 15 , wherein the surface modification slurry component comprises an oxidation slurry component.
17 . The system of claim 15 , wherein the distribution system is adapted to dispense, in a timed sequence, a corrosion inhibiting slurry component.
18 . The system of claim 15 , wherein the distribution system is adapted to dispense a rinsing liquid, in a timed sequence, between the surface modification slurry component and the material removal slurry component.
19 . A method of polishing a substrate, comprising:
providing a substrate in a substrate holder; providing a polishing platform having a moveable polishing pad; and dispensing between the polishing pad and the substrate, in a timed sequence, two or more slurry components each having a different chemical composition.
20 . The method of claim 19 , wherein the two or more slurry components are selected from a group consisting of:
a surface modification slurry component, and a material removal slurry component.Join the waitlist — get patent alerts
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