US2014174363A1PendingUtilityA1
Film forming apparatus
Est. expiryOct 15, 2030(~4.2 yrs left)· nominal 20-yr term from priority
Inventors:Takayuki Komiya
H10P 14/00H10P 14/40C23C 16/38C23C 16/06C23C 16/448C23C 16/4481C23C 16/45502C23C 16/466C23C 16/52H01L 21/02104
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Claims
Abstract
A method for forming a film includes the steps of: placing an object to be processed into a processing container; and generating M(BH 4 ) 4 gas by feeding H 2 gas as carrier gas into a raw material container in which solid M(BH 4 ) 4 (where M is Zr or Hf) is accommodated to introduce a mixture gas of H 2 gas and M(BH 4 ) 4 gas having a volume ratio of flow rates (H 2 /M(BH 4 ) 4 ) of 2 or more into the processing container, and deposit a MB x film (where M is Zr or Hf and x is 1.8 to 2.5) on the object using a thermal CVD.
Claims
exact text as granted — not AI-modified1 - 7 . (canceled)
8 . An apparatus for forming a film, comprising:
a processing container which can be made vacuous; a loading table which is placed in the processing container and loads an object to be processed; a heater which heats the object loaded on the loading table to a predetermined temperature; an exhauster which exhausts the interior of the processing container in a pressure reducing manner; a raw material container holding solid raw material, M(BH 4 ) 4 (where M is Zr or Hf); a temperature regulator which cools or heat-insulates the solid raw material in the raw material container; a H 2 gas feeder which feeds H 2 gas into the raw material container; and a gas feeding pipe through which a mixture gas of H 2 gas and M(BH 4 ) 4 gas is fed from the raw material container into the processing container; wherein the mixture gas of H 2 gas and M(BH 4 ) 4 gas is introduced while controlling a flow rate of the M(BH 4 ) 4 gas evaporated by the feeding of the H 2 gas and a volume ratio of flow rates (H 2 /M(BH 4 ) 4 ) of H 2 gas and M(BH 4 ) 4 gas, by adjusting a flow rate of H 2 gas fed into the raw material container and an internal pressure of the raw material container, and a MB x film (where M is Zr or Hf and x is 1.8 to 2.5) is deposited on the object using a thermal CVD.
9 . The apparatus of claim 8 , wherein an internal pressure of the processing container is set to 10 Pa or more to 300 Pa or less when the MB x film is deposited.
10 . The apparatus of claim 8 , wherein a temperature of the object is set to 160° C. or more to 300° C. or less when the MB x film is deposited.
11 . The apparatus of claim 8 , wherein the H 2 gas is fed while the solid raw material in the raw material container is cooled and maintained in a range of −15° C. to 5° C.Join the waitlist — get patent alerts
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