US2014124795A1PendingUtilityA1
Double layered transparent conductive oxide for reduced schottky barrier in photovoltaic devices
Est. expiryNov 5, 2032(~6.3 yrs left)· nominal 20-yr term from priority
Inventors:Shun-Ming ChenChien-Chih HuangJoel P. DesouzaAugustin J. HongJeehwan KimChien-Yeh KuDevendra K. SadanaChuan-Wen Wang
Y02E10/548H10F 77/1692H10F 77/211H10F 71/138H10F 10/17H10F 77/251Y02E10/547
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Claims
Abstract
A device and method for fabricating a photovoltaic device includes forming a double layer transparent conductive oxide on a transparent substrate. The double layer transparent conductive oxide includes forming a doped electrode layer on the substrate, and forming a buffer layer on the doped electrode layer. The buffer layer includes an undoped or p-type doped intrinsic form of a same material as the doped electrode layer. A light-absorbing semiconductor structure includes a p-type semiconductor layer on the buffer layer, an intrinsic layer and an n-type semiconductor layer.
Claims
exact text as granted — not AI-modified1 . A photovoltaic device, comprising:
a transparent substrate; a double layer transparent conductive oxide formed on the substrate, the double layer including:
a doped electrode layer formed on the substrate; and
a buffer layer formed on the doped electrode layer, the buffer layer including an oppositely doped form of a same material as the doped electrode layer; and
a light-absorbing semiconductor structure including a p-type semiconductor layer on the buffer layer, an intrinsic layer and an n-type semiconductor layer.
2 . The device as recited in claim 1 , wherein the buffer layer includes a work function having a value between values of work functions of the doped electrode layer and the p-type semiconductor layer.
3 . The device as recited in claim 1 , wherein the doped electrode layer and the buffer layer include ZnO.
4 . The device as recited in claim 1 , wherein the buffer layer includes a thickness between about 100 nm and 500 nm.
5 . The device as recited in claim 1 , further comprising a second electrode formed on the light-absorbing semiconductor structure.
6 . The device as recited in claim 1 , wherein the p-type semiconductor layer includes at least one of Si and SiC.
7 . The device as recited in claim 1 , further comprising a textured surface formed on the double layer to provide a three-dimensional structure.
8 . The device as recited in claim 1 , wherein the buffer layer includes p-type dopants increasing in concentration from the doped electrode layer.
9 . The device as recited in claim 1 , wherein the buffer layer includes n-type dopants decreasing in concentration from the doped electrode layer.
10 . The device as recited in claim 1 , wherein the doped electrode layer includes ZnO with one of B or Al dopants.
11 . The device as recited in claim 1 , wherein the buffer layer includes p-type dopants increasing in concentration from the doped electrode layer and n-type dopants decreasing in concentration from the doped electrode layer.
12 . A photovoltaic device, comprising:
a glass substrate; a double layer transparent conductive oxide formed on the substrate, the double layer including:
a doped ZnO layer formed on the substrate; and
an oppositely doped ZnO buffer layer formed on the doped ZnO layer; and
a light-absorbing semiconductor structure including a p-type semiconductor layer on the buffer layer, an intrinsic layer and an n-type semiconductor layer, the buffer layer having a work function value between values of work functions of the doped ZnO layer and the p-type semiconductor layer.
13 . The device as recited in claim 12 , wherein the buffer layer includes a thickness between about 100 nm and 500 nm.
14 . The device as recited in claim 12 , further comprising a second electrode formed on the light-absorbing semiconductor structure.
15 . The device as recited in claim 12 , wherein the p-type semiconductor layer includes at least one of Si and SiC.
16 . The device as recited in claim 12 , further comprising a textured surface formed on the double layer to provide a three-dimensional structure.
17 . The device as recited in claim 12 , wherein the buffer layer includes p-type dopants increasing in concentration from the doped electrode layer.
18 . The device as recited in claim 12 , wherein the buffer layer includes n-type dopants decreasing in concentration from the doped electrode layer.
19 . The device as recited in claim 12 , wherein the doped ZnO layer includes one of B or Al dopants.
20 . The device as recited in claim 12 , wherein the buffer layer includes p-type dopants increasing in concentration from the doped electrode layer and n-type dopants decreasing in concentration from the doped electrode layer.Join the waitlist — get patent alerts
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