Device for measuring properties of scatterers
Abstract
An apparatus for measuring properties of scatterers includes: a paraboloidal mirror or a paraboloidal screen; a specimen platform configured to support the scatterer on a focal point of the paraboloidal mirror or the paraboloidal screen; a generator operable to generate an electromagnetic wave having a predetermined wavelength distribution, wherein the generator is configured and positioned to direct the electromagnetic wave directly at the scatterer from all directions above a plane which includes the focal point; an imaging means for imaging, as planar images, scattering waves which are generated by the scatterer upon receiving the electromagnetic wave directly from the generator, and which are then reflected off the paraboloidal mirror or projected onto the paraboloidal screen; and a conversion means for converting the planar images into scattered light distribution information which includes both azimuth and elevation angle information of the scattering waves.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An apparatus for measuring properties of scatterers, comprising:
a paraboloidal mirror or a paraboloidal screen; a specimen platform configured to support the scatterer on a focal point of the paraboloidal mirror or the paraboloidal screen; a generator operable to generate an electromagnetic wave having a predetermined wavelength distribution, wherein the generator is configured and positioned to direct the electromagnetic wave directly at the scatterer from all directions above a plane which includes the focal point; an imaging means for imaging, as planar images, scattering waves which are generated by the scatterer upon receiving the electromagnetic wave directly from the generator, and which are then reflected off the paraboloidal mirror or projected onto the paraboloidal screen; and a conversion means for converting the planar images into scattered light distribution information which includes both azimuth and elevation angle information of the scattering waves.Join the waitlist — get patent alerts
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