US2014024179A1PendingUtilityA1

Producing method of semiconductor device

Assignee: NITTO DENKO CORPPriority: Jul 17, 2012Filed: Jul 16, 2013Published: Jan 23, 2014
Est. expiryJul 17, 2032(~6 yrs left)· nominal 20-yr term from priority
H10W 90/753H10W 74/01H10H 20/0362H10H 20/01H10H 20/852H01L 21/56
48
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Claims

Abstract

A method for producing a semiconductor device includes a preparing step of preparing a board formed with a concave portion, a terminal disposed in or around the concave portion, and a semiconductor element disposed in the concave portion; a wire-bonding step of connecting the terminal to the semiconductor element with a wire; a pressure-welding step of pressure-welding an encapsulating sheet to the board so as to be in close contact with the upper surface of a portion around the concave portion and to be separated from the upper surface of the concave portion under a reduced pressure atmosphere; and an atmosphere releasing step of releasing the board and the encapsulating sheet under an atmospheric pressure atmosphere.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A method for producing a semiconductor device comprising:
 a preparing step of preparing a board formed with a concave portion, a terminal disposed in or around the concave portion, and a semiconductor element disposed in the concave portion;   a wire-bonding step of connecting the terminal to the semiconductor element with a wire;   a pressure-welding step of pressure-welding an encapsulating sheet to the board so as to be in close contact with the upper surface of a portion around the concave portion and to be separated from the upper surface of the concave portion under a reduced pressure atmosphere; and   an atmosphere releasing step of releasing the board and the encapsulating sheet under an atmospheric pressure atmosphere.   
     
     
         2 . The method for producing a semiconductor device according to  claim 1 , wherein
 after the atmosphere releasing step, a two-step heating step in which heating is performed at a first temperature and thereafter, heating is performed at a second temperature that is higher than the first temperature is further included.   
     
     
         3 . The method for producing a semiconductor device according to  claim 2 , wherein
 the first temperature has a heating temperature range in which the temperature increases to the second temperature.   
     
     
         4 . The method for producing a semiconductor device according to  claim 2 , wherein
 in the two-step heating step, the encapsulating sheet is mechanically pressurized when heated at the first temperature.   
     
     
         5 . The method for producing a semiconductor device according to  claim 2 , wherein
 the encapsulating sheet is prepared from an encapsulating resin composition containing a two-step thermosetting resin, and   in the two-step heating step, the encapsulating sheet is in a B-stage state when heated at the first temperature and the encapsulating sheet is in a C-stage state when heated at the second temperature.   
     
     
         6 . The method for producing a semiconductor device according to  claim 1 , wherein
 after the atmosphere releasing step, a heating and fluid-pressurizing step in which the encapsulating sheet is heated and fluid-pressurized is further included.   
     
     
         7 . The method for producing a semiconductor device according to  claim 1 , wherein
 in the pressure-welding step, the encapsulating sheet has a compressive elastic modulus of 0.16 MPa or less.   
     
     
         8 . The method for producing a semiconductor device according to  claim 1 , wherein
 the length between the upper surface of the concave portion and the upper surface of the portion around the concave portion is 500 μm or less.

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