US2014008345A1PendingUtilityA1
Apparatus and method for repairing broken line of array substrate
Est. expiryJul 3, 2032(~5.9 yrs left)· nominal 20-yr term from priority
Inventors:Wen-Da Cheng
H10W 20/067C21D 1/26G02F 1/136259
36
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Claims
Abstract
The present invention provides an apparatus and a method for repairing a broken line of an array substrate. The apparatus includes a repair unit and a heating unit. The repair unit forms a repair line on a broken-line defect of a wire on the array substrate. The heating unit heats the repair line, so that the molecules constituting the repair line are arranged in sequence according a predetermined rule. The present invention can achieve the repair for a longer broken-line defect.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A repair apparatus for a broken line of an array substrate, comprising:
a repair unit for forming a repair line on a broken-line defect of a wire on the array substrate for connecting the wire; and a heating unit for making a surface of the repair line reach a predetermined temperature, so as to heat the repair line formed by the repair unit.
2 . The repair apparatus of claim 1 , wherein the repair unit specifically comprising:
a removal module for removing a protective layer on both ends of the broken-line defect to expose the both ends of the broken-line defect; and a plated-wire module for forming the repair line on the broken-line defect by using a repair material for connecting the wire.
3 . The repair apparatus of claim 2 , wherein the repair material is chromium hexacarbonyl.
4 . The repair apparatus of claim 2 , wherein the repair material is molybdenum hexacarbonyl.
5 . The repair apparatus of claim 2 , wherein the repair material is tungsten hexacarbonyl.
6 . The repair apparatus of claim 1 , wherein the heating unit is further utilized to heat the repair line formed by the repair unit through laser beams.
7 . The repair apparatus of claim 1 , wherein the predetermined temperature is larger than a melting point of the repair material and less than a boiling point of the repair material.
8 . A repair apparatus for a broken line of an array substrate, comprising:
a repair unit for forming a repair line on a broken-line defect of a wire on the array substrate; and a heating unit for heating the repair line formed by the repair unit.
9 . The repair apparatus of claim 8 , wherein the repair unit specifically comprising:
a removal module for removing a protective layer on both ends of the broken-line defect to expose the both ends of the broken-line defect; and a plated-wire module for forming the repair line on the broken-line defect by using a repair material for connecting the wire.
10 . The repair apparatus of claim 9 , wherein the repair material is chromium hexacarbonyl.
11 . The repair apparatus of claim 9 , wherein the repair material is molybdenum hexacarbonyl.
12 . The repair apparatus of claim 9 , wherein the repair material is tungsten hexacarbonyl.
13 . The repair apparatus of claim 8 , wherein the heating unit is further utilized to heat the repair line formed by the repair unit through laser beams.
14 . The repair apparatus of claim 8 , wherein a heating unit is further utilized to make a surface of the repair line reach a predetermined temperature, wherein the predetermined temperature is larger than a melting point of the repair material and less than a boiling point of the repair material.
15 . A method for repairing a broken line of an array substrate, the method comprising the following steps of:
forming a repair line on a broken-line defect of a wire on the array substrate; and heating the formed repair line.
16 . The method of claim 15 , wherein the step of forming the repair line on the broken-line defect of the wire on the array substrate specifically comprises:
removing a protective layer on both ends of the broken-line defect to expose the both ends of the broken-line defect; and forming the repair line on the broken-line defect by using a repair material for connecting the wire.
17 . The method of claim 16 , wherein the repair material is chromium hexacarbonyl, molybdenum hexacarbonyl, or tungsten hexacarbonyl.
18 . The method of claim 15 , wherein the step of heating the formed repair line specifically comprises:
heating the formed repair line by a laser beam heat treatment.
19 . The method of claim 15 , wherein the step of heating the formed repair line specifically comprises:
making a surface of the repair line reach a predetermined temperature, wherein the predetermined temperature is larger than a melting point of the repair material and less than a boiling point of the repair material.Join the waitlist — get patent alerts
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