US2013333621A1PendingUtilityA1
Apparatus for the deposition of high dielectric constant films
Est. expiryOct 27, 2018(expired)· nominal 20-yr term from priority
H10P 72/0462H10P 14/6334H10P 14/20H10P 10/00H10P 14/60C23C 16/407C23C 16/4409C23C 16/45565C23C 16/4411C23C 16/4405C23C 16/45561C23C 16/452C23C 16/4412C23C 16/4401C23C 16/4557C23C 16/4481C23C 16/54C23C 16/44C23C 16/4586C23C 16/448H01L 21/02271
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Claims
Abstract
An integrated deposition system is described that is capable of vaporizing low vapor pressure liquid precursors and conveying the vapor to a processing region to fabricate advanced integrated circuits. The integrated deposition system includes a heated exhaust system, a remote plasma generator, a processing chamber, a liquid delivery system, and a computer control module that together create a commercially viable and production worthy system for depositing high capacity dielectric materials from low vapor pressure precursors.
Claims
exact text as granted — not AI-modifiedWhat is claimed:
1 . An apparatus for depositing a film, the apparatus comprising:
a chamber body having a processing region defined therein; a vaporizer; a vapor delivery system having a first region beginning at the vaporizer, a second region communicating with the processing region and a third region disposed between the first and second regions, wherein the first region is maintained at a lower temperature than the second region; and a chamber lid disposed on the chamber body and having inner and outer temperature control regions.
2 . The apparatus of claim 1 , wherein a temperature gradient defined over the first and second regions is between about 20 to about 25 degrees Celsius.
3 . The apparatus of claim 1 , wherein the first vapor path further comprises:
a carrier gas supply line is coupled to the first vapor path at a transition between the first and third regions.
4 . The apparatus of claim 1 , wherein a diameter of the third region is greater than a diameter of the first region and less than a diameter of the second region.
5 . The apparatus of claim 1 , wherein a temperature of the third region is greater than a temperature of the first region and less than a temperature of the second region.
6 . The apparatus of claim 1 further comprising:
a hafnium precursor source coupled to the vaporizer.
7 . The apparatus of claim 6 , wherein the temperature gradient is maintained between a minimum temperature of 100 degrees Celsius and a maximum temperature of 190 degrees Celsius.
8 . An apparatus for depositing a film, the apparatus comprising:
a chamber body having a processing region defined therein; a vaporizer; a vapor delivery system having a first region beginning at the vaporizer, a second region communicating with the processing region and a third region disposed between the first and second regions, a diameter of the third region being greater than a diameter of the first region and less than a diameter of the second region; and a chamber lid disposed on the chamber body and having inner and outer temperature control regions.
9 . The apparatus of claim 8 , a carrier gas supply line is coupled to the first vapor path at a transition between the first and third regions.
10 . The apparatus of claim 8 , wherein the first vapor path further comprises:
wherein a temperature gradient defined over the first and second regions is between about 20 to about 25 degrees Celsius.
11 . The apparatus of claim 8 , wherein a temperature of the third region is greater than a temperature of the first region and less than a temperature of the second region.
12 . The apparatus of claim 8 further comprising:
a hafnium precursor source coupled to the vaporizer.
13 . The apparatus of claim 12 , wherein the temperature gradient is maintained between a minimum temperature of 100 degrees Celsius and a maximum temperature of 190 degrees Celsius.Join the waitlist — get patent alerts
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