US2013316629A1PendingUtilityA1
Cmp pad dresser with oriented particles and associated methods
Est. expirySep 29, 2024(expired)· nominal 20-yr term from priority
Inventors:Chien-Min Sung
H10P 52/00B24B 53/12B24B 53/02B24B 53/017B24D 18/00
55
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Claims
Abstract
CMP pad dressers with superabrasive particles oriented into an attitude that controls CMP pad performance, and methods associated therewith are disclosed and described. The controlled CMP pad performance may be selected to optimize CMP pad dressing rate and dresser wear.
Claims
exact text as granted — not AI-modified1 . A method for controlling CMP pad dresser performance in a CMP pad dresser as part of the pad dresser fabrication process, the pad dresser employing a plurality of superabrasive particles comprising:
orienting the superabrasive particles into an attitude that provides an anticipated performance characteristic; and securing the superabrasive particles to a substrate in said attitude.
2 . The method of claim 1 , wherein the performance characteristic is an optimal pad dressing rate.
3 . The method of claim 1 , wherein the performance characteristic is optimal pad dresser wear.
4 . The method of claim 1 , wherein the performance characteristic is an optimized balance of dressing rate and dresser wear.
5 . The method of claim 1 , wherein the superabrasive particles include members selected from a group consisting of: diamond, polycrystalline diamond (PCD), cubic boron nitride (cBN), and polycrystalline cubic boron nitride (PCBN).
6 . The method of claim 1 , wherein the substrate is selected from the group consisting essentially of metallic materials, flexible materials, ceramic materials and mixtures thereof.
7 . The method of claim 1 , wherein superabrasive particles not in a central location on the dresser are disposed in an attitude with a face oriented toward a pad to be dressed.
8 . The method of claim 1 , wherein superabrasive particles not in a central location on the dresser are disposed in an attitude with an apex oriented toward a pad to be dressed.
9 . A chemical mechanical polishing (CMP) pad dresser comprising:
a substrate; and a plurality of superabrasive particles attached to the substrate, said particles being configured in an attitude that controls CMP pad dresser performance.
10 . The CMP pad dresser of claim 9 , wherein superabrasive particles not in a central location on the dresser are disposed in an attitude with a face oriented toward a pad to be dressed.
11 . The CMP pad dresser of claim 9 , wherein superabrasive particles not in a central location on the dresser are disposed in an attitude with an apex oriented toward a pad to be dressed.
12 . The CMP pad dresser of claim 9 , wherein said superabrasive particles have a size from about 100 to 350 micrometers.Join the waitlist — get patent alerts
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