Semiconductor memory device, and method of controlling the same
Abstract
A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
Claims
exact text as granted — not AI-modified1 - 6 . (canceled)
7 . A method of controlling a dynamic random access memory including dynamic memory cells, comprising:
outputting a plurality of control signals to a plurality of lines to put the dynamic random access memory in a low power consumption mode, in which the dynamic memory cells in the dynamic random access memory do not retain data in the low power consumption mode; keeping at least one signal of the plurality of control signals to a first voltage to maintain the low power consumption mode; turning the at least one signal of the plurality of control signals from the first voltage to a second voltage to put the dynamic random access memory out of the low power consumption mode; and waiting for completion of initialization of the dynamic random access memory during a first period, the initialization being performed in response to the at least one signal of the plurality of control signals being turned from the first voltage to the second voltage, wherein the dynamic random access memory continues to be supplied with a power supply voltage in the low power consumption mode.
8 . The method of controlling the dynamic random access memory according to claim 7 , further comprising
stopping an operation of an internal voltage generator configured to supply an internal voltage to the dynamic memory cells in the low power consumption mode.
9 . The method of controlling the dynamic random access memory according to claim 7 , further comprising
stopping a supply of an internal voltage to the dynamic memory cells in the low power consumption mode.
10 . The method of controlling the dynamic random access memory according to claim 7 , further comprising
supplying an internal voltage to the dynamic memory cells in response to the turning to the second voltage, in which the internal voltage is stabilized by the initialization.
11 . The method of controlling the dynamic random access memory according to claim 7 , wherein
the first period is equal to or more than 200 micro seconds.
12 . The method of controlling the dynamic random access memory according to claim 10 , further comprising
generating the internal voltage by an internal voltage generator.
13 . A memory system comprising:
a dynamic random access memory including dynamic memory cells; a memory bus; and a CPU coupled to the dynamic random access memory through the memory bus and configured to control the dynamic random access memory; wherein the CPU outputs a plurality of control signals to the memory bus to put the dynamic random access memory in a low power consumption mode, in which the dynamic memory cells in the dynamic random access memory do not retain data in the low power consumption mode, keeps at least one signal of the plurality of control signals to a first voltage to maintain the low power consumption mode, turns the at least one signal of the plurality of control signals from the first voltage to a second voltage to put the dynamic random access memory out of the low power consumption mode, and waits for completion of initialization of the dynamic random access memory during a first period, the initialization being performed in response to the at least one signal of the plurality of control signals being turned from the first voltage to the second voltage, and wherein the dynamic random access memory continues to be supplied with a power supply voltage in the low power consumption mode.
14 . The memory system according to claim 13 , wherein
the CPU controls a non-volatile memory including flash memory cells through the memory bus.
15 . The memory system according to claim 13 , further comprising
an internal voltage generator configured to stop a supply of an internal voltage to the dynamic memory cells in the low power consumption mode.
16 . The memory system according to claim 13 , further comprising
a voltage line configured to supply an internal voltage to the dynamic memory cells and stop, in the low power consumption mode, a supply of the internal voltage to the dynamic memory cells.
17 . The memory system according to claim 13 , further comprising
a voltage line configured to supply an internal voltage to the dynamic memory cells in response to the turning to the second voltage, in which the internal voltage is stabilized by the initialization.
18 . The memory system according to claim 13 , wherein
the first period is equal to or more than 200 micro seconds.Join the waitlist — get patent alerts
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