Virtual hard media imaging

Abstract

The presently disclosed technology teaches using a tilt-sensitive virtual marking implement to render an impression on an electronic presentation device. Further, a bearing measurement and a tilt measurement of the virtual marking implement are made with respect to the surface. The tilt and bearing are then used to vary geometry of an impression profile associated with the physical marking implement as well as an intensity of the rendering. A user may actively vary the impression profile while he or she produces strokes of the virtual marking implement across the surface without changing the physical marking implement selection or switching to a different virtual marking implement. When creating a rendering on a virtual canvas using the virtual marking implement and the surface, a user may wish to vary an orientation of the virtual marking implement so that a corresponding impression profile mimics an impression of a selected physical marking implement.

1 . A method of presenting on a presentation device a mark modeling a contact area between an implement surface and a marking surface, the method comprising:
 receiving a marking event that specifies a bearing and a tilt measurement of a tilt sensitive input device;   determining a geometry of the mark and an intensity distribution within the mark based on the bearing and the tilt measurement, wherein determining includes determining an offset between a center of intensity of the mark and a dimensional center of the mark based on the tilt measurement; and   presenting the mark via the presentation device.   
     
     
         2 . The method of  claim 1 , wherein the marking event further specifies a pressure measurement of the tilt sensitive input device and one or both of the geometry of the mark and intensity distribution within the mark are further based on the pressure measurement. 
     
     
         3 . The method of  claim 1 , further comprising:
 selecting a tip geometry corresponding to a physical marking implement, wherein one or both of the geometry of the mark and the intensity distribution of the mark are based on the selected tip geometry.   
     
     
         4 . The method of  claim 1 , further comprising:
 mapping the geometry of the mark to an impression bitmap with a bitmap size, wherein the bitmap size is a maximum bitmap size multiplied by a scale factor corresponding to the tilt measurement.   
     
     
         5 . The method of  claim 1 , wherein the implement surface is customizable by a user. 
     
     
         6 . The method of  claim 1 , wherein the implement surface is defined by a combination of user defined tip geometry properties. 
     
     
         7 . A system for presenting a mark modeling a contact area between an implement surface and a marking surface, the system comprising:
 a tilt sensitive input device configured to input a marking event that indicates a bearing and a tilt measurement of the tilt sensitive input device;   a determining module configured to determine a geometry of the mark and an intensity distribution within the mark based on the bearing and the tilt measurement, wherein determining includes determining an offset between a center of intensity of the mark and a dimensional center of the mark based on the tilt measurement; and   a presentation device configured to present the mark.   
     
     
         8 . The system of  claim 7 , further comprising:
 rendering circuitry configured to render the mark on the presentation device.   
     
     
         9 . The system of  claim 7 , wherein the marking event further specifies a pressure measurement of the tilt sensitive input device and one or both of the geometry of the mark and intensity distribution within the mark are further based on the pressure measurement. 
     
     
         10 . The system of  claim 7 , wherein the tilt sensitive input device is further configured to select a tip geometry corresponding to a physical marking implement, and wherein one or both of the geometry of the mark and the intensity distribution of the mark are based on the selected tip geometry. 
     
     
         11 . The system of  claim 7 , further comprising:
 a mapping module configured to map the geometry of the mark to an impression bitmap with a bitmap size, wherein the bitmap size is a maximum bitmap size multiplied by a scale factor corresponding to the tilt measurement.   
     
     
         12 . The system of  claim 7 , wherein the implement surface is customizable by a user. 
     
     
         13 . The system of  claim 7 , wherein the implement surface is defined by a combination of user defined tip geometry properties. 
     
     
         14 . A method of presenting on a presentation device a mark modeling a contact area between an implement surface and a marking surface, the method comprising:
 receiving a marking event that specifies a bearing and a tilt measurement of a tilt sensitive input device;   finding a bitmap that corresponds to the tilt measurement in a look-up table, wherein a geometry of the bitmap and an intensity distribution within the bitmap are based on the tilt measurement, the bitmap including an offset between a center of intensity of the bitmap and a dimensional center of the bitmap;   adjusting the bitmap based on the tilt measurement and the bearing to produce a mark; and   presenting the mark via the presentation device.   
     
     
         15 . The method of  claim 14 , wherein the marking event further specifies a pressure measurement of the tilt sensitive input device and the bitmap is further adjusted based on the pressure measurement. 
     
     
         16 . The method of  claim 14 , further comprising:
 selecting a tip geometry corresponding to a physical marking implement, wherein the selected bitmap further corresponds to the selected tip geometry in the look-up table.   
     
     
         17 . The method of  claim 14 , wherein the implement surface is customizable by a user. 
     
     
         18 . The method of  claim 14 , wherein the implement surface is defined by a combination of user defined tip geometry properties.