US2013288421A1PendingUtilityA1
Method of fabricating a differential doped solar cell
Assignee: BIG SUN ENERGY TECHNOLOGY INCPriority: Dec 22, 2010Filed: Apr 16, 2013Published: Oct 31, 2013
Est. expiryDec 22, 2030(~4.4 yrs left)· nominal 20-yr term from priority
H10F 77/211H10F 71/121H10F 10/14H10F 71/00Y02E10/547Y02P70/50H01L 31/18
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Claims
Abstract
A method of fabricating a differential doped solar cell is provided. The method comprises the steps of (a) providing a light doped semiconductor substrate; (b) forming a heavy doped layer having the same type of dopant used in step (a) on a front surface of the semiconductor substrate; and (c) forming an emitter layer having a different type of dopant used in step (a) on a surface of the heavy doped layer to constitute a p-n junction with the heavy doped layer.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of fabricating a differential doped solar cell comprising the steps of:
(a) providing a light doped semiconductor substrate; (b) forming a heavy doped layer having the same type of dopant used in step (a) on a front surface of the semiconductor substrate; and (c) forming an emitter layer having a different type of dopant used in step (a) on a surface of the heavy doped layer to constitute a p-n junction with the heavy doped layer.
2 . The method as claimed in claim 1 , wherein the light doped semiconductor substrate is a p-type silicon substrate and the emitter layer is an n-type emitter layer.
3 . The method as claimed in claim 1 , wherein the light doped semiconductor substrate is doped with boron.
4 . The method as claimed in claim 1 , further comprising a step of forming a texturing structure on a surface of the light doped semiconductor substrate following the step (a).
5 . The method as claimed in claim 1 , further comprising a step of removing a phosphorus silicate glass layer which is formed on the emitter layer following the step (c).
6 . The method as claimed in claim 1 , further comprising a step of laser edge isolation of cutting a groove having a depth that exceeds the level of the p-n junction along the edge of the semiconductor substrate by a laser beams following the step (c).
7 . The method as claimed in claim 1 , further comprising a step of forming a passivation layer on the emitter layer following the step (c).
8 . The method as claimed in claim 1 , further comprising steps of forming a rear surface electrical conductive paste, a rear surface metal paste and a front surface electrical conductive paste following the step (c).Join the waitlist — get patent alerts
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