US2013241591A1PendingUtilityA1

Apparatus and Method for Screening Electrolytic Capacitors

Assignee: KEMET ELECTRONICS CORPPriority: Dec 18, 2006Filed: May 6, 2013Published: Sep 19, 2013
Est. expiryDec 18, 2026(~0.4 yrs left)· nominal 20-yr term from priority
G01R 31/64H01G 13/00G01R 31/14H01G 9/00G01R 31/1227G01R 31/016
48
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Claims

Abstract

A method for screening electrolytic capacitors places a capacitor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop across the capacitor indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.

Claims

exact text as granted — not AI-modified
1 - 11 . (canceled) 
     
     
         12 . An apparatus for screening capacitors to remove unreliable parts from a large population comprising:
 at least one test capacitor attachment for attaching a test capacitor during a test;   a series resistor in series with said test capacitor;   a first power supply providing a first voltage across said test capacitor and said series resistor;   a voltage detector capable of measuring voltage across said series resistor; and   a second power supply providing a second voltage through a diode across said series resistor.   
     
     
         13 . The apparatus for screening capacitors of  claim 12  wherein said series resistor has a resistance of at least 0.1 Mohm to no more than 10 Mohm; 
     
     
         14 . The apparatus for screening capacitors of  claim 12  further comprising a timer for determining a test time after which said first power supply and said second power supply cease providing voltage to said test capacitor. 
     
     
         15 . The apparatus for screening capacitors of  claim 14  wherein said test time is at least 0.5 min to no more than 5 min. 
     
     
         16 . The apparatus for screening capacitors of  claim 12  wherein series combination of said test capacitor and said series resistor receives at least an average break down voltage. 
     
     
         17 . The apparatus for screening capacitors of  claim 16  wherein combination of said test capacitor and said series resistor receives no more than 1.5 times said average breakdown voltage. 
     
     
         18 . The apparatus for screening capacitors of  claim 12  further comprising a fuse.

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