Test System with Hopper Equipment

Abstract

A test system may be provided in which devices under test (DUTs) are loaded into test trays. Test trays may be moved between test stations using a test conveyor belt. The test system may include loading equipment for placing test trays on the test conveyor belt at desired intervals. The loading equipment may include a feed conveyor belt, tray support structure, and at least one computer-controlled grabber. Test trays may be placed on the feed conveyor belt by test personnel or automated loader. The grabber may be used to transport an incoming test tray from the feed conveyor belt to the support structure. The test tray may be temporarily docked at the support structure. The grabber may then transport the test tray from the support structure to the test conveyor belt so that the DUT on the test tray can be passed to the various test stations for testing.

What is claimed is: 
     
         1 . A method for operating a test system that is used to test a plurality of electronic devices, wherein the test system includes a first conveyor belt, a second conveyor belt, and a fixed support structure, the method comprising:
 moving the plurality of electronic devices from the first conveyor belt to the fixed support structure at a first rate;   moving the plurality of electronic devices from the fixed support structure to the second conveyor belt at a second rate that is at most equal to the first rate; and   with test equipment stationed along the second conveyor belt, testing the plurality of electronic devices.   
     
     
         2 . The method defined in  claim 1 , wherein the plurality of electronic devices comprises a plurality of handheld electronic devices. 
     
     
         3 . The method defined in  claim 1 , wherein the second rate is less than the first rate. 
     
     
         4 . The method defined in  claim 1 , wherein the test system further includes a computer-controlled loader, wherein moving the plurality of electronic devices from the first conveyor belt to the fixed support structure comprises moving the plurality of electronic devices from the first conveyor belt to the fixed support structure with the computer-controlled loader, and wherein moving the plurality of electronic devices from the fixed support structure to the second conveyor belt comprises moving the plurality of electronic devices from the fixed support structure to the second conveyor belt with the computer-controlled loader. 
     
     
         5 . The method defined in  claim 1 , wherein the test system further includes first and second computer-controlled loaders, wherein moving the plurality of electronic devices from the first conveyor belt to the fixed support structure comprises moving the plurality of electronic devices from the first conveyor belt to the fixed support structure with the first computer-controlled loader, and wherein moving the plurality of electronic devices from the fixed support structure to the second conveyor belt comprises moving the plurality of electronic devices from the fixed support structure to the second conveyor belt with the second computer-controlled loader. 
     
     
         6 . The method defined in  claim 5 , further comprising:
 installing the plurality of electronic devices within respective test trays, wherein the test trays include test tray engagement features, and wherein the computer-controlled loader includes loader engagement features configured to engage with the test tray engagement features;   with a first sensor associated with the first conveyor belt, detecting whether an incoming electronic device in the plurality of electronic devices is available to be moved from the first conveyor belt to the fixed support structure by the first computer-controlled loader; and   with a second sensor, identifying a serial number associated with each test tray that is being moved from the first conveyor belt to the fixed support structure by the second computer-controlled loader.   
     
     
         7 . The method defined in  claim 4 , further comprising:
 installing the plurality of electronic devices within respective test trays, wherein the test trays include test tray engagement features, and wherein the computer-controlled loader includes loader engagement features configured to engage with the test tray engagement features.   
     
     
         8 . The method defined in  claim 7 , wherein the test tray engagement features comprise holes, and wherein the loader engagement features comprise pins. 
     
     
         9 . The method defined in  claim 1 , further comprising:
 with sensors associated with the fixed support structure, detecting whether or not the fixed support structure is capable of receiving electronic devices from the first conveyor belt.   
     
     
         10 . The method defined in  claim 1 , further comprising:
 with a sensor associated with the first conveyor belt, detecting whether an incoming electronic device in the plurality of electronic devices is available to be moved from the first conveyor belt to the fixed support structure.   
     
     
         11 . The method defined in  claim 7 , further comprising:
 with a radio-frequency identification sensor, identifying a serial number associated with each test tray that is being moved from the first conveyor belt to the fixed support structure.   
     
     
         12 . A method for operating a test system that is used to test a plurality of electronic devices, wherein the test system includes a test conveyor belt, a fixed support structure, and a loader, the method comprising:
 with the fixed support structure, receiving the plurality of electronic devices;   with the loader, transferring the plurality of electronic devices from the fixed support structure to the test conveyor belt at predetermined time intervals; and   with test equipment stationed along the test conveyor belt, testing the plurality of electronic devices.   
     
     
         13 . The method defined in  claim 12 , wherein the test system further includes a feed conveyor belt, the method further comprising:
 with the feed conveyor belt, sequentially receiving the plurality of electronic devices; and   with the loader, transferring the received plurality of electronic devices from the feed conveyor belt to the fixed support structure one at a time.   
     
     
         14 . The method defined in  claim 12 , wherein the test system further includes an additional loader and a feed conveyor belt, the method further comprising:
 with the feed conveyor belt, sequentially receiving the plurality of electronic devices; and   with the additional loader, transferring the received plurality of electronic devices from the feed conveyor belt to the fixed support structure one at a time.   
     
     
         15 . The method defined in  claim 12 , further comprising:
 installing the plurality of electronic devices within respective test trays, wherein the test trays include test tray engagement features.   
     
     
         16 . The method defined in  claim 15 , wherein the loader comprises a computer-controlled positioner that controls a grabber, and wherein transferring the plurality of electronic devices from the fixed support structure to the test conveyor belt comprises:
 with the grabber, picking up a selected test tray from the fixed support structure by engaging grabber engagement features of the grabber with the test tray engagement features of the selected test tray;   while the grabber engagement features are engaged with the test tray engagement features, transporting the selected test tray from the fixed support structure to the test conveyor belt; and   with the grabber, depositing the selected test tray on the test conveyor belt by disengaging the grabber engagement features of the grabber from the test tray engagement features of the selected test tray.   
     
     
         17 . A test system, comprising:
 a first conveyor belt configured to receive a plurality of devices under test;   a fixed support structure configured to receive the plurality of devices under test from the first conveyor belt;   a second conveyor belt; and   a loader that is configured to move the devices under test from the fixed support structure to the second conveyor belt at fixed time intervals.   
     
     
         18 . The test system defined in  claim 17 , wherein the loader is further configured to move the plurality of devices under test from the first conveyor belt to the fixed support structure. 
     
     
         19 . The test system defined in  claim 17 , further comprising:
 an additional loader that is configured to move the plurality of devices under test from the first conveyor belt to the fixed support structure.   
     
     
         20 . The test system defined in  claim 17 , further comprising:
 a plurality of test trays each of which is configured to house a device under tester in the plurality of devices under test; and   a safety wall positioned over the first conveyor belt, wherein the safety wall is configured so that only a single test tray can pass between an upper surface of first conveyor belt and a lower surface of the safety wall at any given time.