US2013199726A1PendingUtilityA1
Apparatus and a method for treating a substrate
Est. expiryFeb 3, 2032(~5.5 yrs left)· nominal 20-yr term from priority
H10P 95/70H10P 90/128H10P 72/0472H10P 70/20H10P 52/00H10P 50/20H10P 52/402B24C 1/08H01L 21/465
45
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Claims
Abstract
A substrate treating method may include jetting a fluid containing an abrasive onto a substrate, and polishing the substrate using the jetted fluid.
Claims
exact text as granted — not AI-modified1 .- 9 . (canceled)
10 . A substrate treating apparatus comprising:
a supporting unit configured to support a substrate; a nozzle unit configured to jet a fluid containing an abrasive onto the substrate; and a supplying unit configured to supply the fluid to the nozzle unit.
11 . The apparatus of claim 10 , wherein the supplying unit comprises a first storage configured to store a solvent, a second storage configured to store the abrasive, a first supplying conduit configured to connect the first storage to the nozzle unit, and a second supplying conduit configured to connect the second storage to the first supplying conduit.
12 . The apparatus of claim 11 , wherein the second storage stores a chemical, wherein the chemical softens a layer provided on the substrate.
13 . The apparatus of claim 11 , wherein the second storage stores an additive, wherein the additive protects a surface of the substrate or a layer provided on the substrate.
14 . The apparatus of claim 11 , wherein the supplying unit further comprises valves provided on the first and second supplying conduits and a controller, wherein the controller controls the valves to adjust a content of the abrasive in the fluid.
15 . The apparatus of claim 10 , wherein the nozzle unit includes an end portion through which the fluid is jetted, and wherein the end portion of the nozzle unit is located at the same or substantially the same level as a top surface of the substrate and faces a side surface of the supporting unit.
16 . A substrate treating apparatus comprising:
a first module configured to jet a fluid containing an abrasive through a nozzle to a substrate; and an second module configured to transfer the substrate to the first module, wherein the nozzle is positioned over a top surface of the substrate or is positioned adjacent to a side of the substrate.
17 . The substrate treating apparatus of claim 16 , wherein the fluid includes chemical-mechanical polishing (CMP) slurry.
18 . The substrate treating apparatus of claim 16 , wherein the fluid includes a solvent, a chemical, or an additive.
19 . The substrate treating apparatus of claim 18 , wherein the chemical includes KOH, HF, H 2 O 2 , NH 4 OH, HCl, or H 2 SO 4 .
20 . The substrate treating apparatus of claim 18 , wherein the additive includes polyacrylic acid (PAA) or polyethyleneimine (PIE).Join the waitlist — get patent alerts
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